Microscopy and Microanalysis: Volume 14 - Issue S2

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Volume 14 - Supplement S2 - August 2008

Contents

Page 28 of 41

Problem Solving Using Microanalytical Techniques

Research Article

Problem Solving in Electron-probe Microanalysis: Application of Software Tools
PK Carpenter
Published online by Cambridge University Press:

03 August 2008, pp. 1082-1083
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Milli-X-ray Fluorescence X-Ray Spectrum Imaging: Problem Solving Through Mapping on the Centimeter Scale
JM Davis, DE Newbury
Published online by Cambridge University Press:

03 August 2008, pp. 1084-1085
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Meeting microanalysis challenges using a flexible X-ray Fluorescence Microscope
Y Yokota, S Ohzawa, D Matsunaga, Y Sato, S Komatani, A Whitley
Published online by Cambridge University Press:

03 August 2008, pp. 1086-1087
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Confocal Micro X-ray Fluorescence A New Paradigm in 3D Elemental Imaging for Materials Characterization
BM Patterson, GJ Havrilla
Published online by Cambridge University Press:

03 August 2008, pp. 1088-1089
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Characterization of the Interfacial Regions of Copper-Carbon Steel Explosive Welds Using a Combination of Analytical Techniques
JP Chandler, A Manerbino, S Liu, M Kaufman
Published online by Cambridge University Press:

03 August 2008, pp. 1090-1091
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

SIMS Analysis of Xe and Kr in a High Burn-up UO2 Nuclear Fuel
CT Walker, S Brémier, S Portier, R Hasnaoui
Published online by Cambridge University Press:

03 August 2008, pp. 1092-1093
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Analysis of Pu by Virtual-standard WDS-EPMA. Results of an Interlaboratory Round-robin Test
C Merlet, X Llovet, L Aufore, S Brémier, X Deschanels, O Dugne, J Lamontagne, R Restani, C Roche, M Tribet, W Van Renterghem
Published online by Cambridge University Press:

03 August 2008, pp. 1094-1095
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Evaluation of the Significance of Secondary Fluorescence of Aluminum in a Coated Nickel Superalloy
GW Kagel, J Foroughi
Published online by Cambridge University Press:

03 August 2008, pp. 1096-1097
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

X-ray Nano-Analysis of Sub-100nm Particles Using EDS in Conjunction with SEM
S Burgess, J Holland, C Collins, S Sharp
Published online by Cambridge University Press:

03 August 2008, pp. 1098-1099
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

On the Precision of EDS Analysis with Sample Tilted at 70°
P T.-Pinard, P Hovington, H Demers, M Lagace, R Gauvin
Published online by Cambridge University Press:

03 August 2008, pp. 1100-1101
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

X-Ray Mapping of Rough Surfaces with Multiple Silicon Drift Detectors
R Anderhalt, D Redfern, A Sandborg
Published online by Cambridge University Press:

03 August 2008, pp. 1102-1103
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Practical Analysis of Micron-scale Boride and Carbide Inclusions Using an Analytical SDD Detector
C Collins, S Burgess, F Bauer, J Holland
Published online by Cambridge University Press:

03 August 2008, pp. 1104-1105
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Wavelength Dispersive X-ray Spectrometry Element Mapping and Mineralogy Based Manipulation: Assessment as a Method for Distinguishing Forensic Soil Samples
CS Schwandt
Published online by Cambridge University Press:

03 August 2008, pp. 1106-1107
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Multi-Detector X-Ray Mapping and Generation of Correction Factor Images for Problem Solving
R Wuhrer, K Moran, MR Phillips
Published online by Cambridge University Press:

03 August 2008, pp. 1108-1109
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Compositional Variations and Modeling in Low Alloy Steel Welds
JJ McGee, DB Knorr
Published online by Cambridge University Press:

03 August 2008, pp. 1110-1111
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Comparison of the Defect Microstructure of Silicon Dioxide Thin Films and Buried Oxide Layers Determined Using Cathodoluminescence Microanalysis
MA Stevens-Kalceff
Published online by Cambridge University Press:

03 August 2008, pp. 1112-1113
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Surface Enhanced Raman (SERS) Nanoparticle Delivery Device for in-situ Sample Analysis
TJ Tague Jr, M Leona
Published online by Cambridge University Press:

03 August 2008, pp. 1114-1115
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Advances in High Resolution CT and Dimensional Measuring
D Moller-Gunderson, K Brockdorf, O Brunke
Published online by Cambridge University Press:

03 August 2008, pp. 1116-1117
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Enhancing Contrast of Al Traces on Si Substrates using Low-voltage SEM-hosted XRM
BC Gundrum, JA Hunt, MA Zurbuchen
Published online by Cambridge University Press:

03 August 2008, pp. 1118-1119
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Identifying Foreign Material Contamination in Food and Food Ingredients
VL St. Jeor, AD Lape, AR Muroski, C McGuire, DL Elmore
Published online by Cambridge University Press:

03 August 2008, pp. 1120-1121
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Page 28 of 41

Microscopy and Microanalysis

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Volume 14 - Supplement S2 - August 2008

Problem Solving Using Microanalytical Techniques

Research Article

Problem Solving in Electron-probe Microanalysis: Application of Software Tools

Milli-X-ray Fluorescence X-Ray Spectrum Imaging: Problem Solving Through Mapping on the Centimeter Scale

Meeting microanalysis challenges using a flexible X-ray Fluorescence Microscope

Confocal Micro X-ray Fluorescence A New Paradigm in 3D Elemental Imaging for Materials Characterization

Characterization of the Interfacial Regions of Copper-Carbon Steel Explosive Welds Using a Combination of Analytical Techniques

SIMS Analysis of Xe and Kr in a High Burn-up UO2 Nuclear Fuel

Analysis of Pu by Virtual-standard WDS-EPMA. Results of an Interlaboratory Round-robin Test

Evaluation of the Significance of Secondary Fluorescence of Aluminum in a Coated Nickel Superalloy

X-ray Nano-Analysis of Sub-100nm Particles Using EDS in Conjunction with SEM

On the Precision of EDS Analysis with Sample Tilted at 70°

X-Ray Mapping of Rough Surfaces with Multiple Silicon Drift Detectors

Practical Analysis of Micron-scale Boride and Carbide Inclusions Using an Analytical SDD Detector

Wavelength Dispersive X-ray Spectrometry Element Mapping and Mineralogy Based Manipulation: Assessment as a Method for Distinguishing Forensic Soil Samples

Multi-Detector X-Ray Mapping and Generation of Correction Factor Images for Problem Solving

Compositional Variations and Modeling in Low Alloy Steel Welds

Comparison of the Defect Microstructure of Silicon Dioxide Thin Films and Buried Oxide Layers Determined Using Cathodoluminescence Microanalysis

Surface Enhanced Raman (SERS) Nanoparticle Delivery Device for in-situ Sample Analysis

Advances in High Resolution CT and Dimensional Measuring

Enhancing Contrast of Al Traces on Si Substrates using Low-voltage SEM-hosted XRM

Identifying Foreign Material Contamination in Food and Food Ingredients

Microscopy and Microanalysis

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Volume 14 - Supplement S2 - August 2008

Problem Solving Using Microanalytical Techniques

Research Article