Microscopy and Microanalysis: Volume 14 - Issue S2

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Volume 14 - Supplement S2 - August 2008

Contents

Page 26 of 41

FIB-Based Applications and Instrumentation Advances for the Physical and Biological Sciences

Research Article

Advanced FIB-based sample preparation for 3D characterization of 45nm ICs
F Lorut, D Delille
Published online by Cambridge University Press:

03 August 2008, pp. 1002-1003
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Specimen Preparation for Cross-Section Atom Probe Analysis
D Lawrence, R Alvis, D Olson
Published online by Cambridge University Press:

03 August 2008, pp. 1004-1005
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

New FIB Fold-Out Method for TEM Cross-Section Sample Preparation
HC Floresca, J Jeon, MJ Kim
Published online by Cambridge University Press:

03 August 2008, pp. 1006-1007
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Study of FIB Damage in Carbonaceous Materials using XANES
ND Bassim, BT DeGregoio, RM Stroud, PE Fischione
Published online by Cambridge University Press:

03 August 2008, pp. 1008-1009
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

FIB and HRTEM Characterization of Surface Oxides on Polysilicon MEMS after Cyclic Loading
A Avishai, H Kahn, R Ballarini, A Heuer
Published online by Cambridge University Press:

03 August 2008, pp. 1010-1011
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Charge-contrast in SEM imaging with simultaneous ion bombardment
BD Myers, JR Wilson, VP Dravid, SA Barnett
Published online by Cambridge University Press:

03 August 2008, pp. 1012-1013
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Assessing the Internal Structure and Composition of Climatically-Relevant Atmospheric Particles Using Focused Ion Beam Milling and X-ray Microanalysis
JM Conny, DB Klinedinst, S Eustis
Published online by Cambridge University Press:

03 August 2008, pp. 1014-1015
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

A quantitative study on focused on beam milling in a cryogenic environment
J Fu, SB Joshi, JM Catchmark, G Ning
Published online by Cambridge University Press:

03 August 2008, pp. 1016-1017
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Repetitive Grain Boundary Chemical Analysis by Atom Probe Microscopy
DJ Larson, PH Clifton, RL Alvis, DP Olson, J Weng, SA Gerstl, F Chen
Published online by Cambridge University Press:

03 August 2008, pp. 1018-1019
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

In-situ Scanning Transmission Electron Microscopy Study on the Microstructural Characterization of a TFT-LCD Panel by a FIB/SEM
YJ Park, SH Han, HN Kim
Published online by Cambridge University Press:

03 August 2008, pp. 1020-1021
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Fabricating Atom Probe Tomography Specimens from TEM foils
MK Miller, KF Russell, DT Hoelzer
Published online by Cambridge University Press:

03 August 2008, pp. 1022-1023
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Recent Advances in 3D Materials Characterization using DualBeams
W Neijssen, LY Roussel
Published online by Cambridge University Press:

03 August 2008, pp. 1024-1025
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Critical Dimension Monitoring with STEM in Thin Film Magnetic Head Wafer Production
H Wang, J Fang, M Lederman
Published online by Cambridge University Press:

03 August 2008, pp. 1026-1027
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

OmniGIS Gas Injection System for Ion Beam Induced Deposition and Etching
DN Leonard, A Dhawan, PE Russell
Published online by Cambridge University Press:

03 August 2008, pp. 1028-1029
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Preparation of AlGaN-based High Electron Mobility Transistor Devices using Focused Ion Beam Milling
DA Cullen, DJ Smith
Published online by Cambridge University Press:

03 August 2008, pp. 1030-1031
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Problem Solving with Light Microscopy

Research Article

The Importance of Polarized Light Microscopy in the Analytical Setting
S Sparenga
Published online by Cambridge University Press:

03 August 2008, pp. 1032-1033
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Microscopy Outside The Box
B Heeschen
Published online by Cambridge University Press:

03 August 2008, pp. 1034-1035
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Solving Archaeological Mysteries with the Light Microscope
M King, K Brinsko, A Bowen, S Sparenga
Published online by Cambridge University Press:

03 August 2008, pp. 1036-1037
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Dynamic Experiments in Light Microscopy
DR Rothe, R Samson, E Czerwinski
Published online by Cambridge University Press:

03 August 2008, pp. 1038-1039
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Stereological Characterization of the Geometry of Three Dimensional Microstructures

Research Article

Stereological Characterization of the Geometry of Three Dimensional Microstructures
RT DeHoff
Published online by Cambridge University Press:

03 August 2008, pp. 1040-1041
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Page 26 of 41

Microscopy and Microanalysis

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Volume 14 - Supplement S2 - August 2008

FIB-Based Applications and Instrumentation Advances for the Physical and Biological Sciences

Research Article

Advanced FIB-based sample preparation for 3D characterization of 45nm ICs

Specimen Preparation for Cross-Section Atom Probe Analysis

New FIB Fold-Out Method for TEM Cross-Section Sample Preparation

Study of FIB Damage in Carbonaceous Materials using XANES

FIB and HRTEM Characterization of Surface Oxides on Polysilicon MEMS after Cyclic Loading

Charge-contrast in SEM imaging with simultaneous ion bombardment

Assessing the Internal Structure and Composition of Climatically-Relevant Atmospheric Particles Using Focused Ion Beam Milling and X-ray Microanalysis

A quantitative study on focused on beam milling in a cryogenic environment

Repetitive Grain Boundary Chemical Analysis by Atom Probe Microscopy

In-situ Scanning Transmission Electron Microscopy Study on the Microstructural Characterization of a TFT-LCD Panel by a FIB/SEM

Fabricating Atom Probe Tomography Specimens from TEM foils

Recent Advances in 3D Materials Characterization using DualBeams

Critical Dimension Monitoring with STEM in Thin Film Magnetic Head Wafer Production

OmniGIS Gas Injection System for Ion Beam Induced Deposition and Etching

Preparation of AlGaN-based High Electron Mobility Transistor Devices using Focused Ion Beam Milling

Problem Solving with Light Microscopy

Research Article

The Importance of Polarized Light Microscopy in the Analytical Setting

Microscopy Outside The Box

Solving Archaeological Mysteries with the Light Microscope

Dynamic Experiments in Light Microscopy

Stereological Characterization of the Geometry of Three Dimensional Microstructures

Research Article

Stereological Characterization of the Geometry of Three Dimensional Microstructures

Microscopy and Microanalysis

Refine listing

Actions for selected content:

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Volume 14 - Supplement S2 - August 2008

FIB-Based Applications and Instrumentation Advances for the Physical and Biological Sciences

Research Article

Problem Solving with Light Microscopy

Research Article

Stereological Characterization of the Geometry of Three Dimensional Microstructures

Research Article