Hostname: page-component-7479d7b7d-c9gpj Total loading time: 0 Render date: 2024-07-12T11:25:47.011Z Has data issue: false hasContentIssue false
  • English
  • Français

X-ray Nano-Analysis of Sub-100nm Particles Using EDS in Conjunction with SEM

Published online by Cambridge University Press:  03 August 2008

S Burgess ,
J Holland ,
C Collins  and
S Sharp
S Burgess
Affiliation:
Oxford Instruments NanoAnalysis, United Kingdom
J Holland
Affiliation:
Oxford Instruments NanoAnalysis, United Kingdom
C Collins
Affiliation:
Oxford Instruments NanoAnalysis, United Kingdom
S Sharp
Affiliation:
Oxford Instruments NanoAnalysis, United Kingdom
Get access

Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Type
Research Article
Information
Microscopy and Microanalysis , Volume 14 , Supplement S2 , August 2008 , pp. 1098 - 1099
Copyright
© 2008 Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)