Microscopy and Microanalysis: Volume 14 - Issue S2

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Volume 14 - Supplement S2 - August 2008

Contents

Page 11 of 41

High Resolution and Analytical Characterization of Engineered Nanostructures

Research Article

P-N Junction Observation in a Single Transistor Device by In-situ TEM Electrical Measurement
SY Park, D Cha, O Lourie, MJ Kim
Published online by Cambridge University Press:

03 August 2008, pp. 402-403
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Study of Epitaxial Germanium Quantum Dots in Silicon by Off-axis Electron Holography
L LI, MR McCartney, DJ Smith, S Ketharanathan, J Drucker
Published online by Cambridge University Press:

03 August 2008, pp. 404-405
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Microstructural and Radial Distribution Function Analysis of Hydrogenated Silicon, Germanium, and Silicon-Germanium Alloy Thin Films
DB Saint John, NJ Podraza, BD Gauntt, J Li, EC Dickey
Published online by Cambridge University Press:

03 August 2008, pp. 406-407
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Quantitative Chemical Mapping of Engineered Interfaces in Quaternary III-V Semiconductor Heterostructures Using Phase Retrieval High Resolution Transmission Electron Microscopy
K Mahalingam, HJ Haugan, GJ Brown, KG Eyink
Published online by Cambridge University Press:

03 August 2008, pp. 408-409
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

CNT-FET Schottky Barrier Devices Fabricated by E-beam Lithography
D Perello, MJ Kim, SY Jeong, BR Kang, DJ Bae, YH Lee, M Yun
Published online by Cambridge University Press:

03 August 2008, pp. 410-411
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

TEM Characterization of Nanoindentation in Nanoscale Metallic Multilayers
D Bhattacharyya, N Mara, P Dickerson, R Hoagland, A Misra
Published online by Cambridge University Press:

03 August 2008, pp. 412-413
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

TEM Correlation between the Structural and Optical Properties Of Rotationally Twinned InP Nanowires
DC Bell, J Bao, F Capasso, J Wagner, T Martensson, J Trägårdh, L Samuelson
Published online by Cambridge University Press:

03 August 2008, pp. 414-415
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Characterization of CNTs-Al dispersions using FE-TEM and FE-SEM
D Poirier, R Gauvin, RAL Drew
Published online by Cambridge University Press:

03 August 2008, pp. 416-417
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Thermal Stability of Hf-Based Gate Dielectric Stacks with Rare-Earth Oxide Capping Layers
JM LeBeau, JS Jur, DJ Lichtenwalner, AI Kingon, DO Klenov, S Stemmer
Published online by Cambridge University Press:

03 August 2008, pp. 418-419
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Electron Energy Loss Spectroscopy Measurements of Amorphization of Polymorphs of TiO2 Induced by Ion Irradiation
NJ Zaluzec, KL Smith, GR Lumpkin, MG Blackford, KR Whittle
Published online by Cambridge University Press:

03 August 2008, pp. 420-421
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

A TEM Study of Alkaline-Earth Metal Hexaboride Nanowires
S Li, S Amin, T Xu, VP Dravid
Published online by Cambridge University Press:

03 August 2008, pp. 422-423
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

4D STEM/EELS Characterization of Au Nanodots in a ZnO Thin Film
DN Leonard, K Jarausch, RD Twesten
Published online by Cambridge University Press:

03 August 2008, pp. 424-425
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Quantitative Characterisation of Surfaces and Defects on PtRu Nanoparticles Using Combined Exit Wave Restoration and Aberration-Corrected TEM
LY Chang, C Maunders, EA Baranova, C Bock, GA Botton
Published online by Cambridge University Press:

03 August 2008, pp. 426-427
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Direct Structural Investigation of Bi3.25La0.75Ti3O12 thin films on SrRuO3/(111) SrTiO3
L Gunawan, O Gautreau, C Harnagea, A Pignolet, GA Botton
Published online by Cambridge University Press:

03 August 2008, pp. 428-429
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Atomic-Level Gas-Solid Interaction during In Situ Redox Processes in Ceria
R Wang, PA Crozier, R Sharma, J Adams
Published online by Cambridge University Press:

03 August 2008, pp. 430-431
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Deep RIE and Cryo-Etching of Nanostructures in Silicon and Polymers
G DeRose, M Shearn, D Henry, Y Chen, A Scherer
Published online by Cambridge University Press:

03 August 2008, pp. 432-433
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Nanobead Formation and Nanopatterning in Glasses
G Möbus, J Tsai, XJ Xu, P Bingham, G Yang
Published online by Cambridge University Press:

03 August 2008, pp. 434-435
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Atomic-resolution Studies of Ca3Co4O9 using in-situ Scanning Transmission Electron Microscopy
G Yang, Y Zhao, K Sader, A Bleloch, RF Klie
Published online by Cambridge University Press:

03 August 2008, pp. 436-437
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Characterization of Al In GaN/GaN Heterointerface by HAADF-STEM and Electron Holography
M Takeguchi, H Okuno, Y Irokawa, Y Sakuma, K Furuya
Published online by Cambridge University Press:

03 August 2008, pp. 438-439
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Preparation and characterization of titanate nanotubes
M Klementová, Z Kváča, P Bezdička, E Večerníková, M Mohyla
Published online by Cambridge University Press:

03 August 2008, pp. 440-441
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Page 11 of 41

Microscopy and Microanalysis

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Volume 14 - Supplement S2 - August 2008

High Resolution and Analytical Characterization of Engineered Nanostructures

Research Article

P-N Junction Observation in a Single Transistor Device by In-situ TEM Electrical Measurement

Study of Epitaxial Germanium Quantum Dots in Silicon by Off-axis Electron Holography

Microstructural and Radial Distribution Function Analysis of Hydrogenated Silicon, Germanium, and Silicon-Germanium Alloy Thin Films

Quantitative Chemical Mapping of Engineered Interfaces in Quaternary III-V Semiconductor Heterostructures Using Phase Retrieval High Resolution Transmission Electron Microscopy

CNT-FET Schottky Barrier Devices Fabricated by E-beam Lithography

TEM Characterization of Nanoindentation in Nanoscale Metallic Multilayers

TEM Correlation between the Structural and Optical Properties Of Rotationally Twinned InP Nanowires

Characterization of CNTs-Al dispersions using FE-TEM and FE-SEM

Thermal Stability of Hf-Based Gate Dielectric Stacks with Rare-Earth Oxide Capping Layers

Electron Energy Loss Spectroscopy Measurements of Amorphization of Polymorphs of TiO2 Induced by Ion Irradiation

A TEM Study of Alkaline-Earth Metal Hexaboride Nanowires

4D STEM/EELS Characterization of Au Nanodots in a ZnO Thin Film

Quantitative Characterisation of Surfaces and Defects on PtRu Nanoparticles Using Combined Exit Wave Restoration and Aberration-Corrected TEM

Direct Structural Investigation of Bi3.25La0.75Ti3O12 thin films on SrRuO3/(111) SrTiO3

Atomic-Level Gas-Solid Interaction during In Situ Redox Processes in Ceria

Deep RIE and Cryo-Etching of Nanostructures in Silicon and Polymers

Nanobead Formation and Nanopatterning in Glasses

Atomic-resolution Studies of Ca3Co4O9 using in-situ Scanning Transmission Electron Microscopy

Characterization of Al In GaN/GaN Heterointerface by HAADF-STEM and Electron Holography

Preparation and characterization of titanate nanotubes

Microscopy and Microanalysis

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Volume 14 - Supplement S2 - August 2008

High Resolution and Analytical Characterization of Engineered Nanostructures

Research Article