Hostname: page-component-76fb5796d-skm99 Total loading time: 0 Render date: 2024-04-26T06:53:10.311Z Has data issue: false hasContentIssue false
  • English
  • Français

Quantitative Chemical Mapping of Engineered Interfaces in Quaternary III-V Semiconductor Heterostructures Using Phase Retrieval High Resolution Transmission Electron Microscopy

Published online by Cambridge University Press:  03 August 2008

K Mahalingam ,
HJ Haugan ,
GJ Brown  and
KG Eyink
K Mahalingam
Affiliation:
Air Force Research Laboratory
HJ Haugan
Affiliation:
Air Force Research Laboratory
GJ Brown
Affiliation:
Air Force Research Laboratory
KG Eyink
Affiliation:
Air Force Research Laboratory
Get access

Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Type
Research Article
Information
Microscopy and Microanalysis , Volume 14 , Supplement S2 , August 2008 , pp. 408 - 409
Copyright
© 2008 Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)