Microscopy and Microanalysis: Volume 14 - Issue S2

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Volume 14 - Supplement S2 - August 2008

Contents

Page 12 of 41

High Resolution and Analytical Characterization of Engineered Nanostructures

Research Article

Nucleation and Growth of Magnetic Nanoparticles in a Na-Ca-B-Fe Amorphous Precursor by Electron Beam Irradiation
MA Laurenzi III, W-A Chiou, IL Pegg
Published online by Cambridge University Press:

03 August 2008, pp. 442-443
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Tomography of High-k Dielectrics on Fin-FET Sidewalls
B Foran, N Ives, P Lysaght
Published online by Cambridge University Press:

03 August 2008, pp. 444-445
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Physical and electrical characterization of the interface between atomic-layer-deposited Al2O3 on GaAs substrates for CMOS applications
DI Garcia-Gutierrez, V Kaushik, D Shahrjerdi, S Banerjee
Published online by Cambridge University Press:

03 August 2008, pp. 446-447
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Exploring the Morphological Diversity of Amyloid's Cross-β Structure
WS Childers, Y Liang, R Ni, AK Mehta, JV Taylor, DG Lynn
Published online by Cambridge University Press:

03 August 2008, pp. 448-449
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Stress Relaxation by Cation Ordering in Epitaxial Lead Zirconate Titanate Films
L Zhang, A Vasiliev, IB Misirlioglu, SP Alpay, M Aindow, R Ramesh
Published online by Cambridge University Press:

03 August 2008, pp. 450-451
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Interface Structure of a V2O3 Layer Grown on Cu3Au (001) by Cs Corrected Transmission Electron Microscopy
H Calderon, H Niehus, B Freitag, D Wall, F Stavale, CA Achete
Published online by Cambridge University Press:

03 August 2008, pp. 452-453
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Performance Advantages of a Modern, Ultra-High Mass Resolution Atom Probe
P Clifton, T Gribb, S Gerstl, RM Ulfig, DJ Larson
Published online by Cambridge University Press:

03 August 2008, pp. 454-455
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Analysis of Silicon Nanowires by Laser Atom Probe Tomography Prepared by a Protected Lift-Out Processing Technique
T Prosa, R Alvis, L Tsakalakos, V Smentkowski
Published online by Cambridge University Press:

03 August 2008, pp. 456-457
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Microstructural Investigation of Pd/Pt/Au and Pd/Ru/Au Ohmic Contacts to InAlSb/InAs Heterostructures for High Electron Mobility Transistors
Q Zhang, R Dormaier, S Mohney
Published online by Cambridge University Press:

03 August 2008, pp. 458-459
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Nanofabrication by 3D E-beam Cutting
T Gnanavel, Z Saghi, Y Peng, G Möbus
Published online by Cambridge University Press:

03 August 2008, pp. 460-461
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Characterization with TEM of AlN/GaN Heterostructures for Implant Activation Annealing
TS Zheleva, CE Hager, KA Jones, MA Derenge
Published online by Cambridge University Press:

03 August 2008, pp. 462-463
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Surface Microscopy and Microanalysis in Materials and Biological Systems

Research Article

Characterizing Nanomaterials by Combining Electron Microscopy and Surface Analysis
DJ Gaspar, DR Baer, Z Zhu, BW Arey, C Wang, MG Warner, AL Miracle
Published online by Cambridge University Press:

03 August 2008, pp. 464-465
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Molecular Depth Profiling to 3D Molecular Imaging with XPS and TOF-SIMS
JS Hammond, GL Fisher, S Raman, JF Moulder
Published online by Cambridge University Press:

03 August 2008, pp. 466-467
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Analysis of Multi-Component Polymer Blends with the Confocal Raman AFM
U Schmidt, J Mueller, K Weishaupt, O Hollricher
Published online by Cambridge University Press:

03 August 2008, pp. 468-469
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Surface Microscopy and Microanalysis in the Medical Device Industry
AM Belu
Published online by Cambridge University Press:

03 August 2008, pp. 470-471
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

New Approaches in Accelerating Material Development Through Structure-to-Property Relationships built from XPS and Microscopic Data
K Artyushkova, JE Fulghum, P Atanassov
Published online by Cambridge University Press:

03 August 2008, pp. 472-473
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Correlative Microscopic and Spectroscopic Characterization of Carboxylated Single-Walled Carbon Nanotubes
P Bajaj, K Artyushkova, I Musselman
Published online by Cambridge University Press:

03 August 2008, pp. 474-475
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Probing Polymeric Interfaces with Synchrotron Techniques
JL Lenhart, DA Fischer
Published online by Cambridge University Press:

03 August 2008, pp. 476-477
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Surface Versus Bulk Defects on Devices using Complementary Techniques
VS Smentkowski, SG Ostrowski, L Denault, CG Woychik
Published online by Cambridge University Press:

03 August 2008, pp. 478-479
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Evaluation of Chemical State Analysis and Imaging by Micro XPS
H Iwai, H Yoshikawa, S Fukushima, S Tanuma
Published online by Cambridge University Press:

03 August 2008, pp. 480-481
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Page 12 of 41

Microscopy and Microanalysis

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Volume 14 - Supplement S2 - August 2008

High Resolution and Analytical Characterization of Engineered Nanostructures

Research Article

Nucleation and Growth of Magnetic Nanoparticles in a Na-Ca-B-Fe Amorphous Precursor by Electron Beam Irradiation

Tomography of High-k Dielectrics on Fin-FET Sidewalls

Physical and electrical characterization of the interface between atomic-layer-deposited Al2O3 on GaAs substrates for CMOS applications

Exploring the Morphological Diversity of Amyloid's Cross-β Structure

Stress Relaxation by Cation Ordering in Epitaxial Lead Zirconate Titanate Films

Interface Structure of a V2O3 Layer Grown on Cu3Au (001) by Cs Corrected Transmission Electron Microscopy

Performance Advantages of a Modern, Ultra-High Mass Resolution Atom Probe

Analysis of Silicon Nanowires by Laser Atom Probe Tomography Prepared by a Protected Lift-Out Processing Technique

Microstructural Investigation of Pd/Pt/Au and Pd/Ru/Au Ohmic Contacts to InAlSb/InAs Heterostructures for High Electron Mobility Transistors

Nanofabrication by 3D E-beam Cutting

Characterization with TEM of AlN/GaN Heterostructures for Implant Activation Annealing

Surface Microscopy and Microanalysis in Materials and Biological Systems

Research Article

Characterizing Nanomaterials by Combining Electron Microscopy and Surface Analysis

Molecular Depth Profiling to 3D Molecular Imaging with XPS and TOF-SIMS

Analysis of Multi-Component Polymer Blends with the Confocal Raman AFM

Surface Microscopy and Microanalysis in the Medical Device Industry

New Approaches in Accelerating Material Development Through Structure-to-Property Relationships built from XPS and Microscopic Data

Correlative Microscopic and Spectroscopic Characterization of Carboxylated Single-Walled Carbon Nanotubes

Probing Polymeric Interfaces with Synchrotron Techniques

Surface Versus Bulk Defects on Devices using Complementary Techniques

Evaluation of Chemical State Analysis and Imaging by Micro XPS

Microscopy and Microanalysis

Refine listing

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Volume 14 - Supplement S2 - August 2008

High Resolution and Analytical Characterization of Engineered Nanostructures

Research Article

Surface Microscopy and Microanalysis in Materials and Biological Systems

Research Article