Microscopy and Microanalysis: Volume 23 - Proceedings of Microscopy & Microanalysis 2017

View selected items
Save to my bookmarks
Export citations
Download PDF (zip)
Save to Kindle
Save to Dropbox
Save to Google Drive
Save content to
To save this undefined to your undefined account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you used this feature, you will be asked to authorise Cambridge Core to connect with your undefined account. Find out more about saving content to .

To save this article to your Kindle, first ensure coreplatform@cambridge.org is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about saving to your Kindle.

Note you can select to save to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be saved to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Please be advised that item(s) you selected are not available.
You are about to save
Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
Your Kindle email address

Please provide your Kindle email.

@free.kindle.com @kindle.com (service fees apply)

By using this service, you agree that you will only keep content for personal use, and will not openly distribute them via Dropbox, Google Drive or other file sharing services

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Proceedings of Microscopy & Microanalysis 2017

Analytical and Instrumentation Science Symposia

Pushing the Limits of Cryo-TEM: Development and Applications

Abstract

Cryo-STEM Tomography with Inpainting

Electron Beam Sources using InGaN Semiconductor Photocathodes for Single-shot Imaging Electron Microscope

New Strategies for Improving CryoEM Single Particle Analysis in EMAN2.2

Towards High Resolution in Cryo-Electron Tomography Subtomogram Analysis

Going Deeper in Cryo Electron Tomography with Neural Networks

Phase Contrast Single Particle Analysis at Atomic Resolutions

Efficient Cryo-EM: Measuring Effects of Particle Orientation in Electron Microscopy

Streptavidin Monolayer-Crystal Affinity Grids: A Step Toward Controlling What Happens During Cryo-EM Sample Preparation

Ion Channel in Lipid Nanodisc By Single Particle Cryo-EM - Pushing The Technology Limit

Lessons Learned from using a Cs-Corrected, Energy-Filtered, Phase-Plate TEM for Single-Particle CryoEM

Development of High-Resolution Transmission Electron Microscopes for Analysis of Biomolecular Structure

Electrostatic Zach Phase Plates for Transmission Electron Microscopy: Status and Future Investigations

Contamination and Charging of Amorphous Thin Films Suitable as Phase Plates for Phase-Contrast Transmission Electron Microscopy

Improving Detectors for Cryo-Electron Microscopy

On-the-Fly Image Quality Evaluation for Single-Particle Analysis Cryo-Electron Microscopy

Accurate Cryo-EM Characterizations of Polypeptoid Vesicles

The Future of Direct Electron Detection in Cryo-TEM

The Title of This Paper Should Be in Title Case (See Below), Single Spaced, Times New Roman, Bold 14-point, and the Text Should Be Left Justified

Hole-Free Phase Plate Energy Filtering Imaging of Graphene: Toward Quantitative Hole-Free Phase Plate Imaging in a TEM

Cryo-FIB Lift-out Sample Preparation Using a Novel Cryo-gripper Tool

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Save Search

Proceedings of Microscopy & Microanalysis 2017

Analytical and Instrumentation Science Symposia

Pushing the Limits of Cryo-TEM: Development and Applications

Abstract