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Advances in X-ray Analysis, First Pacific-International Congress on X-ray Analytical Methods (PICXAM). Fortieth Annual Conference on Applications of X-ray Analysis, August 7-16, 1991

Volume 35 - Issue A - 1991

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I. Whole Pattern Fitting, Rietveld Analysis and Calculated Diffraction Patterns

II. Quantitative Phase Analysis by X-Ray Diffraction (XRD)

III. Thin-Film and Surface Characterization by XRD

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