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Applications of Rietveld Analysis to Materials Characterization in Solid-State Chemistry, Physics and Mineralogy

Published online by Cambridge University Press:  06 March 2019

R.J. Hill
R.J. Hill*
Affiliation:
CSIRO Division of Mineral Products PO Box 124, Port Melbourne VIC 3207, Australia
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The utilization and optimization of the properties of materials follows most effectively from a detailed knowledge and understanding of the positions and energetics of their constituent atoms, generally obtained from scattering/diffraction experiments involving electrons, neutrons or electromagnetic radiation. For the most part, these experiments are undertaken on individual crystals of the material, thereby preserving the resolution (and information content) of the three-dimensional reciprocal lattice. However, many of the substances of greatest academic and technical importance either do not crystallize with dimensions large enough for single-crystal studies, or display the properties of maximal interest only when present in finely-divided (powdered) form. In a diffraction experiment, the reciprocal lattice is then collapsed on to the single dimension of the 2θ scale.

Type
I. Whole Pattern Fitting, Rietveld Analysis and Calculated Diffraction Patterns
Information
Advances in X-Ray Analysis , Volume 35 , Issue A: First Pacific-International Congress on X-ray Analytical Methods (PICXAM). Fortieth Annual Conference on Applications of X-ray Analysis, August 7-16, 1991 , 1991 , pp. 25 - 38
Copyright
Copyright © International Centre for Diffraction Data 1991

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