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Rietveld Analysis and Pair Wise Substitutional Alloys

Published online by Cambridge University Press:  06 March 2019

Wayne D. Kaplan  and
Giora Kimmel
Wayne D. Kaplan
Affiliation:
Department Materials Engineering Technion, Haifa, Israel
Giora Kimmel
Affiliation:
Department Materials Engineering Technion, Haifa, Israel
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Abstract

Rietveld Analysis on X-Ray powder diffraction data was used to build a comprehensive model of the structures in gallmm rich R-Ga systems (R is a rare earth between La and Gd). The ability to refine occupation factors as well as atomic positions allowed for the analysis of the e solid solution, its structural relation to the ordered ∊′ phase, and the unique role of the Ga-Ga pairs in these systems.

Type
I. Whole Pattern Fitting, Rietveld Analysis and Calculated Diffraction Patterns
Information
Advances in X-Ray Analysis , Volume 35 , Issue A: First Pacific-International Congress on X-ray Analytical Methods (PICXAM). Fortieth Annual Conference on Applications of X-ray Analysis, August 7-16, 1991 , 1991 , pp. 63 - 68
Copyright
Copyright © International Centre for Diffraction Data 1991

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References

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