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Comparison of Experimental STEM Conditions for Fluctuation Electron Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue 6 / December 2020
- Published online by Cambridge University Press:
- 27 August 2020, pp. 1100-1109
- Print publication:
- December 2020
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Structural Mapping of Disordered Materials by Nanobeam Diffraction Imaging and Multivariate Statistical Analysis
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- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue 2 / April 2013
- Published online by Cambridge University Press:
- 11 March 2013, pp. 300-309
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- April 2013
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The Formation and Utility of Sub-Angstrom to Nanometer-Sized Electron Probes in the Aberration-Corrected Transmission Electron Microscope at the University of Illinois
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue 2 / April 2010
- Published online by Cambridge University Press:
- 26 February 2010, pp. 183-193
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- April 2010
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