15 results
OPTICAL PROPERTIES OF Ge NANOWIRES GROWN ON SILICON (100) AND (111) SUBSTRATES
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- Journal:
- MRS Online Proceedings Library Archive / Volume 832 / 2004
- Published online by Cambridge University Press:
- 01 February 2011, F7.20
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- 2004
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High Resolution Electron Microscopy (HREM) Study of Chemically Vapor Deposited Polycrystalline Si1-xGex Thin Films
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- Journal:
- MRS Online Proceedings Library Archive / Volume 609 / 2000
- Published online by Cambridge University Press:
- 17 March 2011, A8.4
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- 2000
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Resistivity and Hall Voltage Investigation of Phosphorus Segregation in Polycrystalline Si1-xGex Thin Films
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- Journal:
- MRS Online Proceedings Library Archive / Volume 609 / 2000
- Published online by Cambridge University Press:
- 17 March 2011, A8.3
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- 2000
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A Stem Study of P and Ge Segregation to Grain Boundaries in Si1-xGex Thin Films
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- Journal:
- MRS Online Proceedings Library Archive / Volume 557 / 1999
- Published online by Cambridge University Press:
- 15 February 2011, 201
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- 1999
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Dopant Implantation and Activation in Polycrystalline-SiGe
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- Journal:
- MRS Online Proceedings Library Archive / Volume 343 / 1994
- Published online by Cambridge University Press:
- 15 February 2011, 685
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- 1994
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Diffusion of Ge Along Grain Boundaries During Oxidation of Polycrystalline Silicon-Germanium Films
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- Journal:
- MRS Online Proceedings Library Archive / Volume 319 / 1993
- Published online by Cambridge University Press:
- 21 February 2011, 183
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- 1993
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The Extraction of Minority Carrier Lifetime from the Current-Voltage Characteristics of Si/Si1−xGex Devices
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- Journal:
- MRS Online Proceedings Library Archive / Volume 220 / 1991
- Published online by Cambridge University Press:
- 22 February 2011, 385
- Print publication:
- 1991
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Epitaxial Growth of Sil-xGex/Si Heterostructures by Limited Reaction Processing for Minority Carrier Device Applications
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- Journal:
- MRS Online Proceedings Library Archive / Volume 146 / 1989
- Published online by Cambridge University Press:
- 25 February 2011, 71
- Print publication:
- 1989
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Onset of Misfit Dislocation Generation in As-Grown and Annealed Sil-XGex/Si Films
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- Journal:
- MRS Online Proceedings Library Archive / Volume 130 / 1988
- Published online by Cambridge University Press:
- 22 February 2011, 179
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- 1988
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Growth of Gallium Arsenide on Silicon in Masked, Etched Trenches
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- Journal:
- MRS Online Proceedings Library Archive / Volume 116 / 1988
- Published online by Cambridge University Press:
- 28 February 2011, 99
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- 1988
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Electrical Properties of Polycrystalline-Silicon Thin Films for VLSI
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- Journal:
- MRS Online Proceedings Library Archive / Volume 71 / 1986
- Published online by Cambridge University Press:
- 28 February 2011, 261
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- 1986
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Heavy Metal Gettering in Implanted Buried-Oxide Structures
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- Journal:
- MRS Online Proceedings Library Archive / Volume 53 / 1985
- Published online by Cambridge University Press:
- 28 February 2011, 239
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- 1985
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Lateral Seeding of Silicon-On-Insulator Using an Elliptical Laser Beam: A Comparison of Scanning Methods
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- Journal:
- MRS Online Proceedings Library Archive / Volume 33 / 1984
- Published online by Cambridge University Press:
- 21 February 2011, 81
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- 1984
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Offset-Gate Structures for Increased Breakdown Voltages in Silicon-On-Insulator Transistors
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- Journal:
- MRS Online Proceedings Library Archive / Volume 33 / 1984
- Published online by Cambridge University Press:
- 21 February 2011, 133
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- 1984
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Laser–Recrystallized SOI Devices: Promises and Pitfalls
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- Journal:
- MRS Online Proceedings Library Archive / Volume 33 / 1984
- Published online by Cambridge University Press:
- 21 February 2011, 109
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- 1984
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