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Electronic and ionic transport underpins functionality of broad range of electronic and energy devices, and is an active field of applied and fundamental research. The lecture series on Kelvin probe force microscopy and scanning probe microscopy (SPM) based current-voltage (I-V) transport measurements introduces the basic principles of SPM techniques for transport measurements based on potential and current detection, describes the multitude of dynamics variants of KPFM, KPFM-based transport measurements, and its implementation in ambient, vacuum, and liquid environments and associated artifacts. Multidimensional current- and capacitance-based transport measurements are described. The lectures are available at YouTube: https://www.youtube.com/playlist?list=PLS6ZvEWHZ3OOkRFPTrnsV3Ej09UGUjor3.
Scanning probe microscopies (SPM) have opened the window into characterization of nanoscale functionalities of a broad panoply of materials and devices. This lecture series summarizes the principles, theoretical basis, techniques, and applications of piezoresponse force microscopy and electrochemical strain microscopies, the SPM techniques based on the electromechanical detection. The image formation mechanisms, spectroscopic and excitation modes, imaging in ambient, liquid, and vacuum environments and associated artifacts are discussed, as are application to broad ranges of materials systems from ferroelectrics to energy and information technology materials to biological systems. The lectures are available at YouTube: https://www.youtube.com/playlist?list=PLS6ZvEWHZ3OPifI9LVKnHX7tK38iTltOD.