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The ORNL Lectures on Scanning Probe Microscopy, Part 2: The Force Dimension: Electronic and Ionic Transport Measurements via Kelvin Probe Force Microscopy

  • Sergei V. Kalinin (a1)

Abstract

Electronic and ionic transport underpins functionality of broad range of electronic and energy devices, and is an active field of applied and fundamental research. The lecture series on Kelvin probe force microscopy and scanning probe microscopy (SPM) based current-voltage (I-V) transport measurements introduces the basic principles of SPM techniques for transport measurements based on potential and current detection, describes the multitude of dynamics variants of KPFM, KPFM-based transport measurements, and its implementation in ambient, vacuum, and liquid environments and associated artifacts. Multidimensional current- and capacitance-based transport measurements are described. The lectures are available at YouTube: https://www.youtube.com/playlist?list=PLS6ZvEWHZ3OOkRFPTrnsV3Ej09UGUjor3.

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References

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Keywords

The ORNL Lectures on Scanning Probe Microscopy, Part 2: The Force Dimension: Electronic and Ionic Transport Measurements via Kelvin Probe Force Microscopy

  • Sergei V. Kalinin (a1)

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