17 results
Electron Counted STEM-EELS Spectroscopy Optimized for low kV (< 80 kV) via Hybrid Pixel Detection
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 2226-2228
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- August 2022
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Unveiling the Ferroelectric Behavior of HfO2 Thin Films Using Fast DualEELS Analysis
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 588-589
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- August 2019
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The Performance of Electron Counting Direct Detection in Electron Energy Loss Spectroscopy
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 586-587
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- August 2019
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Benefits of a High Speed Low Point Spread Detector For Monochromated Electron Energy-Loss Spectroscopy
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 680-681
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- August 2019
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Using EELS to Determine He Pressure Inside Nanometer-Scale Bubbles
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 438-439
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- August 2018
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Advantages of Direct Detection and Electron Counting for High-Energy Resolution and Monochromated Electron Energy Loss Spectroscopy Data Acquisition
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- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 474-475
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- August 2018
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Advantages of Direct Detection and Electron Counting for Electron Energy Loss Spectroscopy Data Acquisition and the Quest of Extremely High-Energy Edges Using Eels
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 60-61
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- July 2017
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Atomic Elemental and Chemical Analysis of SrTiO3/LaMnO3 Multilayers Using Fast Simultaneous EELS and EDS Analysis in DigitalMicrograph
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- Journal:
- Microscopy Today / Volume 23 / Issue 4 / July 2015
- Published online by Cambridge University Press:
- 02 July 2015, pp. 44-53
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- July 2015
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Observation of layer by layer graphitization of 4H-SiC, through atomic-EELS at low energy
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 560-561
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- August 2014
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Probing the Chemical Structure in Diamond-Based Materials Using Combined Low-Loss and Core-Loss Electron Energy-Loss spectroscopy
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- Microscopy and Microanalysis / Volume 20 / Issue 3 / June 2014
- Published online by Cambridge University Press:
- 25 March 2014, pp. 779-783
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- June 2014
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Simultaneous EELS/EDS Composition Mapping at Atomic Resolution Using Fast STEM Spectrum-Imaging
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- Microscopy Today / Volume 21 / Issue 4 / July 2013
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- 19 July 2013, pp. 36-40
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- July 2013
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Fast STEM Spectrum Imaging Using Simultaneous EELS and EDS
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- Microscopy Today / Volume 21 / Issue 1 / January 2013
- Published online by Cambridge University Press:
- 21 December 2012, pp. 28-33
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- January 2013
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Atomic-Level EELS Mapping Using High-Energy Edges in Dualeels™ Mode
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- Microscopy Today / Volume 20 / Issue 4 / July 2012
- Published online by Cambridge University Press:
- 23 July 2012, pp. 30-36
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- July 2012
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Outlook of Application of Aberration Corrected-Electron Microscopy in the Ligandprotected Metal Clusters
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- Journal:
- Microscopy and Microanalysis / Volume 10 / Issue S03 / August 2004
- Published online by Cambridge University Press:
- 01 August 2004, pp. 62-63
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- August 2004
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Structural Comparisons of SiOx and Si/SiOx Formed by Passivation of Single-Crystal Silicon by Atomic and Molecular Oxygen
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- MRS Online Proceedings Library Archive / Volume 786 / 2003
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- 01 February 2011, E4.7
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- 2003
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Local Measurements of Surfaces Stress
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- MRS Online Proceedings Library Archive / Volume 379 / 1995
- Published online by Cambridge University Press:
- 15 February 2011, 263
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- 1995
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Visualization of Dynamic Near-Surface Processes
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- MRS Bulletin / Volume 19 / Issue 6 / June 1994
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- 29 November 2013, pp. 38-43
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- June 1994
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