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Local Measurements of Surfaces Stress

  • Ray D. Twesten (a1) and J. Murray Gibson (a1) (a2)

Abstract

We have recently developed a method of local stress measurement that can be applied at the submicron level to measure differences in intrinsic stress at both free surfaces and buried interfaces. The method exploits the fact that transmission electron microscopy readily reveals local bulk strain fields produced by surface or interfacial stress differences. Using quantitative image analysis and simulation, we can determine the value of this stress difference. We have successfully applied this technique to the clean Si(111) surface during 7×7-1×1 phase coexistence and have determined the stress difference to be 30±5 meV/Å2.

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1 Webb, M.B., Surf. Sci. 299/300, 454 (1993).
2 Alerhand, O.L., Vanderbilt, D., Meade, R.D. and Joannopoulos, J.D., Phys. Rev. Lett. 61, 1973 (1988).
3 Martinez, R.E., Augustyniak, W.M. and Golovchenko, J.A., Phys. Rev. Lett. 64, 1035 (1990); K. Rao, R.E. Martinez and J.A. Golovchenko, Surf. Sci 227 323 (1992).
4 Schell-Sorokin, A.J. and Tromp, R.M., Phys. Rev. Lett. 64,1039 (1990).
5 see Cammarata, R.C., Progress in Surf. Sci. 46, 1 (1994) and references there in.
6 Webb, M.B., Men, F.K., Swartzentruber, B.S., Kariotis, R. and Legally, M.G. Surf. Sci. 242, 23(1991)
7 Twesten, R.D. and Gibson, J.M., Phys. Rev B50, 17628 (1994).
8 Sparnaay, M.J., Surf. Sci. Rep. 4, 101 (1993).
9 Hirsch, M.A., Howie, A., Nicholson, R., Pashley, D.W. and Whelan, M.J., Electron Microscopy of Thin Crystals, (Butterworth, London, 1967).
10 McDonald, M.L., Gibson, J.M. and Unterwald, F.C., Rev. Sci. Instrum. 60, 700 (1989).
11 Marshall, M.T., Tong, X. and Gibson, J.M., in Proc. 51st Annual Meeting of the Microscopy Society of America, edited by Bailey, G.W. and Reider, C.L. (San Francisco Press, San Fransico, 1993) p. 641
12 Twesten, R.D. and Gibson, J.M., Ultramicroscopy 53, 223 (1994).
13 Zeitler, E., Ultramicroscopy 46 405 (1992).
14 Reimer, L, Transmission Electron Microscopy 2 ND Ed., (Springer-Verlag, Berlin, 1989).

Local Measurements of Surfaces Stress

  • Ray D. Twesten (a1) and J. Murray Gibson (a1) (a2)

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