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Electron Counted STEM-EELS Spectroscopy Optimized for low kV (< 80 kV) via Hybrid Pixel Detection
Published online by Cambridge University Press: 22 July 2022
Abstract
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- Type
- Electron Microscopy of Beam Sensitive Samples: The Trials and Tribulations of Electron-beam Sample Interactions
- Information
- Copyright
- Copyright © Microscopy Society of America 2022
References
Dectris detecting the future, https://www.dectris.com (accessed February 22, 2022).Google Scholar
RdR acknowledges the support of the EPIC facility of Northwestern University's NUANCE Center, which has received support from the SHyNE Resource (NSF ECCS-2025633), the IIN, and Northwestern's MRSEC program (NSF DMR-1720139). This research was supported in part through the computational resources and staff contributions provided for the Quest high performance computing facility at Northwestern University which is jointly supported by the Office of the Provost, the Office for Research, and Northwestern University Information Technology.Google Scholar