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Observation of layer by layer graphitization of 4H-SiC, through atomic-EELS at low energy

Published online by Cambridge University Press:  27 August 2014

Giuseppe Nicotra ,
Paolo Longo ,
Ioannis Deretzis ,
Mario Scuderi ,
Antonino La Magna ,
Filippo Giannazzo ,
Ray D Twesten  and
Corrado Spinella
Giuseppe Nicotra
Affiliation:
CNR-IMM, Strada VIII, 5, 95121 Catania, Italy
Paolo Longo
Affiliation:
Gatan, Inc., 5794 W Las Positas Blvd, Pleasanton, CA, 94588, USA
Ioannis Deretzis
Affiliation:
CNR-IMM, Strada VIII, 5, 95121 Catania, Italy
Mario Scuderi
Affiliation:
CNR-IMM, Strada VIII, 5, 95121 Catania, Italy
Antonino La Magna
Affiliation:
CNR-IMM, Strada VIII, 5, 95121 Catania, Italy
Filippo Giannazzo
Affiliation:
CNR-IMM, Strada VIII, 5, 95121 Catania, Italy
Ray D Twesten
Affiliation:
Gatan, Inc., 5794 W Las Positas Blvd, Pleasanton, CA, 94588, USA
Corrado Spinella
Affiliation:
CNR-IMM, Strada VIII, 5, 95121 Catania, Italy

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 560 - 561
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Nicotra, G, et al, ACS Nano 7(4 (2013) p. 3045.2.Google Scholar
[2] Nicotra, G, et al, to be published.Google Scholar
[3] This work was performed at Beyondnano CNR-IMM, which is supported by the Italian Ministry of Education and Research (MIUR) under project Beyond-Nano (PON a3_00363).Google Scholar