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Strain Mapping Using EBSD Cross Correlation and Raman Methods
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 960-961
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- August 2018
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Signal variability in replicate ice cores
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- Journal:
- Journal of Glaciology / Volume 51 / Issue 174 / 2005
- Published online by Cambridge University Press:
- 08 September 2017, pp. 462-468
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Excellent Agreement Between High Resolution EBSD and XRD Strain Measurements on Si1-xGex films on Si
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- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 690-691
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- August 2013
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Effect of crystallographic orientation on phase transformations during indentation of silicon
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- Journal of Materials Research / Volume 24 / Issue 3 / March 2009
- Published online by Cambridge University Press:
- 31 January 2011, pp. 1172-1183
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- March 2009
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Giant pop-ins in nanoindented silicon and germanium caused by lateral cracking
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- Journal of Materials Research / Volume 23 / Issue 2 / February 2008
- Published online by Cambridge University Press:
- 31 January 2011, pp. 297-301
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- February 2008
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Measurements of the Band Offset of SiO2 on Clean GaN
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- Journal:
- MRS Online Proceedings Library Archive / Volume 693 / 2001
- Published online by Cambridge University Press:
- 21 March 2011, I9.10.1
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- 2001
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Phase-Separated Inorganic-Organic Hybrids for Microelectronic Applications
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- MRS Bulletin / Volume 22 / Issue 10 / October 1997
- Published online by Cambridge University Press:
- 29 November 2013, pp. 44-48
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- October 1997
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Electrical resistance of metallic contacts on silicon and germanium during indentation
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- Journal:
- Journal of Materials Research / Volume 7 / Issue 4 / April 1992
- Published online by Cambridge University Press:
- 31 January 2011, pp. 961-972
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- April 1992
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Alternative Length Scales for Polycrystalline Materials
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- MRS Online Proceedings Library Archive / Volume 209 / 1990
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- 26 February 2011, 27
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- 1990
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