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Strain Mapping Using EBSD Cross Correlation and Raman Methods

Published online by Cambridge University Press:  01 August 2018

M.D. Vaudin ,
AJ Gayle ,
L.H. Friedman  and
R.F. Cook
M.D. Vaudin
Affiliation:
Materials Measurement Science Division, National Institute of Standards and Technology (NIST), Gaithersburg, MD.
AJ Gayle
Affiliation:
Materials Measurement Science Division, National Institute of Standards and Technology (NIST), Gaithersburg, MD.
L.H. Friedman
Affiliation:
Materials Measurement Science Division, National Institute of Standards and Technology (NIST), Gaithersburg, MD.
R.F. Cook
Affiliation:
Materials Measurement Science Division, National Institute of Standards and Technology (NIST), Gaithersburg, MD.

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 960 - 961
Copyright
© Microscopy Society of America 2018 

References

References:

[1] Wilkinson, AJ, Meaden, G Dingley, DJ Mater. Sci. Technol. 22 2006) p. 1271.Google Scholar
[2] Vaudin, MD, et al, Ultramicroscopy 148 2015) p. 94.Google Scholar
[3] Friedman, LH, et al, Ultramicroscopy 163 2016) p. 75.Google Scholar
[4] Britton, TB, et al, Ultramicroscopy 135 2013) p. 136.Google Scholar
[5] No endorsement by NIST is intended or implied by the identification of certain commercial equipment instruments, or materials in this paper.Google Scholar
[6] Gayle, AJ, et al, J Appl. Phys. 122 2017) p. 205101.Google Scholar