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Visualizing Redox Chemistry in Oxide Surfaces at Atomic-Resolution
M. Ek, Q.M. Ramasse, L. Arnarson, P.G. Moses, C.F. Kisielowski, J.R. Jinschek, S. Helveg
Journal:

Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017

Published online by Cambridge University Press:

04 August 2017, pp. 904-905

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July 2017
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Investigating Molecule-plasmon Interactions in Chemically-functionalized Metal Nanoparticles Using Monochromated EELS
P. Abellan, P.Z. El-Khoury, F.S. Hage, J. Cottom, A.G. Joly, W.P. Hess, R. Brydson, Q.M. Ramasse
Journal:

Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017

Published online by Cambridge University Press:

04 August 2017, pp. 1540-1541

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July 2017
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Atomic study of Hybrid Spintronic Heterostructures: Co2FeAl05Si0.5/Ge(111)
Z Nedelkoski, D.M. Kepaptsoglou, B. Keurbanjiang, Q.M. Ramasse, A. Ghasemi, C. Love, S. Cavill, K. Hamaya, S. P. Tear, V.K. Lazarov
Journal:

Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017

Published online by Cambridge University Press:

04 August 2017, pp. 1762-1763

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July 2017
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Recent Applications of Sub-20meV Monochromated STEM-EELS: from Phonon to Core Losses in Real and Momentum Spaces
Q.M. Ramasse, F.S. Hage, D.M. Kepaptsoglou, P. Abellan, J. Yates, R.J. Nicholls, H.C. Nerl, V. Nicolosi, K. Winther, K. Thygesen, P.Z. El Khoury, W.P. Hess, F. Azough, R. Freer
Journal:

Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016

Published online by Cambridge University Press:

25 July 2016, pp. 964-965

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July 2016
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VEELS Study of Boron and Nitrogen Doped Single Layer Graphene
F.S. Hage, D.M. Kepaptsoglou, T.P. Hardcastle, C.R. Seabourne, A.J. Scott, R. Brydson, R. Zan, J. Amani, H. Hofsass, U. Bangert, Q.M. Ramasse
Journal:

Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015

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23 September 2015, pp. 743-744

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August 2015
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Vibrational phonon spectroscopy of boron nitride polymorphs: a comparison between theory and experiment
R. Nicholls, F.S. Hage, J. Yates, D. McCulloch, D.M. Kepaptsoglou, T.C. Lovejoy, N. Dellby, O.L. Krivanek, K. Refson, Q.M. Ramasse
Journal:

Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015

Published online by Cambridge University Press:

23 September 2015, pp. 1469-1470

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August 2015
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Atomic study of Fe3O4/SrTiO3 Interface
D. Gilks, D.M. Kepaptsoglou, K. McKenna, L. Lari, Q.M. Ramasse, K. Matsuzaki, T. Susaki, V.K. Lazarov
Journal:

Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015

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23 September 2015, pp. 1299-1300

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August 2015
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Linking Microstructure and Local Chemistry in Cu(In,Ga)Se2 Thin-Film Solar Cells
E. Simsek, Q.M. Ramasse, D. Abou-Ras, R. Mainz, A. Weber, H.-J. Kleebe, P.A. van Aken
Journal:

Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015

Published online by Cambridge University Press:

23 September 2015, pp. 2279-2280

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August 2015
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STEM and EELS study of the Graphene/Bi2Se3 Interface
D.M. Kepaptsoglou, D. Gilks, L. Lari, Q.M. Ramasse, P. Galindo, M. Weinert, L. Li, G. Nicotra, V.K. Lazarov
Journal:

Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015

Published online by Cambridge University Press:

23 September 2015, pp. 1151-1152

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August 2015
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Crystal Structure, Cation Occupancy and Vacancy Ordering in Thermoelectric (1-x)SrTiO3-xLa1/3NbO3: A STEM-EELS Study
F. Azough, D.M Kepaptsoglou, D. Srivastava, Q.M. Ramasse, R. Freer
Journal:

Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014

Published online by Cambridge University Press:

27 August 2014, pp. 1958-1959

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August 2014
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Atom-by-Atom STEM Investigation of Defect Engineering in Graphene
Q.M. Ramasse, D.M. Kepapstoglou, F.S. Hage, T. Susi, J. Kotakoski, C. Mangler, P. Ayala, J. Meyer, J.A. Hinks, S. Donnelly, R. Zan, C.T. Pan, S.J. Haigh, U. Bangert
Journal:

Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014

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27 August 2014, pp. 1736-1737

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August 2014
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Electronic Structure Modification of Boron and Nitrogen Ion-Implanted Graphene Fingerprinted by STEM-EELS
D.M. Kepaptsoglou, C.R. Seabourne, T. Hardcastle, R. Nicholls, W. Pierce, R. Zan, U. Bangert, A.J. Scott, Q.M. Ramasse
Journal:

Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014

Published online by Cambridge University Press:

27 August 2014, pp. 1734-1735

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August 2014
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Atomic-Scale STEM-EELS Characterization of the Chemistry of Structural Defects and Interfaces in Energy-Related Materials
Q.M. Ramasse, F. Azough, R. Freer, D.M. Kepaptsoglou, R. Mainz, A. Weber, D. Abou-Ras, E. Simsek, P.A. van Aken
Journal:

Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014

Published online by Cambridge University Press:

27 August 2014, pp. 562-563

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August 2014
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Performance and Stability of Dedicated Aberration-Corrected STEMs: a User's Perspective
D.M. Kepaptsoglou, A.R. Lupini, D. Mücke-Herzberg, G. Vaughan, Q.M. Ramasse
Journal:

Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014

Published online by Cambridge University Press:

27 August 2014, pp. 924-925

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August 2014
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Defects in Two Dimensional Crystals: An Ultra-high Resolution Aberration-corrected Electron Microscopy Study
N. Alem, Q.M. Ramasse, O.V. Yazyev, C.R. Seabourne, C.K. Kisielowski, P. Hartel, B. Jiang, R. Erni, K. Erickson, M. Sarahan, M. Rossell, A. Scott, S. Louie, A. Zettl
Journal:

Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013

Published online by Cambridge University Press:

09 October 2013, pp. 618-619

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August 2013
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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Atomic-Scale Analysis of Chemical Bonding of Delaminated Graphene at Faceted SiC by Aberration-Corrected Scanning Transmission Electron Microscopy
G. Nicotra, Q.M. Ramasse, I. Deretzis, C. Bongiorno, C. Spinella, F. Giannazzo
Journal:

Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013

Published online by Cambridge University Press:

09 October 2013, pp. 1238-1239

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August 2013
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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Quantitative Crystallographic and Statistical Image Processing for Materials Science in Scanning Transmission Electron Microscopy
Q.M. Ramasse, M.C. Sarahan, D.G. Morgan, N.D. Browning
Journal:

Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013

Published online by Cambridge University Press:

09 October 2013, pp. 772-773

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August 2013
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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Analytical TEM Study of the Microstructure of LaNiO3/LaAlO3 Superlattices
E. Detemple, Q.M. Ramasse, W. Sigle, G. Cristiani, H.-U. Habermeier, B. Keimer, P.A. van Aken
Journal:

Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013

Published online by Cambridge University Press:

09 October 2013, pp. 1888-1889

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August 2013
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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Topologically Induced Confinement of Collective Modes in Polycrystalline Graphene Nano-cones: Measured By Momentum Transfer Dependent STEM-VEELS
F.S. Hage, Q.M. Ramasse, D.M. Kepaptsoglou, Ø. Prytz, G. Helgesen, R. Brydson
Journal:

Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013

Published online by Cambridge University Press:

09 October 2013, pp. 1512-1513

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August 2013
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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Detection of Single Atoms and Buried Defects in Three Dimensions by Aberration-Corrected Electron Microscope with 0.5-Å Information Limit
C. Kisielowski, B. Freitag, M. Bischoff, H. van Lin, S. Lazar, G. Knippels, P. Tiemeijer, M. van der Stam, S. von Harrach, M. Stekelenburg, M. Haider, S. Uhlemann, H. Müller, P. Hartel, B. Kabius, D. Miller, I. Petrov, E.A. Olson, T. Donchev, E.A. Kenik, A.R. Lupini, J. Bentley, S.J. Pennycook, I.M. Anderson, A.M. Minor, A.K. Schmid, T. Duden, V. Radmilovic, Q.M. Ramasse, M. Watanabe, R. Erni, E.A. Stach, P. Denes, U. Dahmen
Journal:

Microscopy and Microanalysis / Volume 14 / Issue 5 / October 2008

Published online by Cambridge University Press:

16 September 2008, pp. 469-477

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October 2008
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The ability of electron microscopes to analyze all the atoms in individual nanostructures is limited by lens aberrations. However, recent advances in aberration-correcting electron optics have led to greatly enhanced instrument performance and new techniques of electron microscopy. The development of an ultrastable electron microscope with aberration-correcting optics and a monochromated high-brightness source has significantly improved instrument resolution and contrast. In the present work, we report information transfer beyond 50 pm and show images of single gold atoms with a signal-to-noise ratio as large as 10. The instrument's new capabilities were exploited to detect a buried Σ3 {112} grain boundary and observe the dynamic arrangements of single atoms and atom pairs with sub-angstrom resolution. These results mark an important step toward meeting the challenge of determining the three-dimensional atomic-scale structure of nanomaterials.

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Visualizing Redox Chemistry in Oxide Surfaces at Atomic-Resolution

Investigating Molecule-plasmon Interactions in Chemically-functionalized Metal Nanoparticles Using Monochromated EELS

Atomic study of Hybrid Spintronic Heterostructures: Co2FeAl05Si0.5/Ge(111)

Recent Applications of Sub-20meV Monochromated STEM-EELS: from Phonon to Core Losses in Real and Momentum Spaces

VEELS Study of Boron and Nitrogen Doped Single Layer Graphene

Vibrational phonon spectroscopy of boron nitride polymorphs: a comparison between theory and experiment

Atomic study of Fe3O4/SrTiO3 Interface

Linking Microstructure and Local Chemistry in Cu(In,Ga)Se2 Thin-Film Solar Cells

STEM and EELS study of the Graphene/Bi2Se3 Interface

Crystal Structure, Cation Occupancy and Vacancy Ordering in Thermoelectric (1-x)SrTiO3-xLa1/3NbO3: A STEM-EELS Study

Atom-by-Atom STEM Investigation of Defect Engineering in Graphene

Electronic Structure Modification of Boron and Nitrogen Ion-Implanted Graphene Fingerprinted by STEM-EELS

Atomic-Scale STEM-EELS Characterization of the Chemistry of Structural Defects and Interfaces in Energy-Related Materials

Performance and Stability of Dedicated Aberration-Corrected STEMs: a User's Perspective

Defects in Two Dimensional Crystals: An Ultra-high Resolution Aberration-corrected Electron Microscopy Study

Atomic-Scale Analysis of Chemical Bonding of Delaminated Graphene at Faceted SiC by Aberration-Corrected Scanning Transmission Electron Microscopy

Quantitative Crystallographic and Statistical Image Processing for Materials Science in Scanning Transmission Electron Microscopy

Analytical TEM Study of the Microstructure of LaNiO3/LaAlO3 Superlattices

Topologically Induced Confinement of Collective Modes in Polycrystalline Graphene Nano-cones: Measured By Momentum Transfer Dependent STEM-VEELS

Detection of Single Atoms and Buried Defects in Three Dimensions by Aberration-Corrected Electron Microscope with 0.5-Å Information Limit

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20 results