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Recent Applications of Sub-20meV Monochromated STEM-EELS: from Phonon to Core Losses in Real and Momentum Spaces

Published online by Cambridge University Press:  25 July 2016

Q.M. Ramasse ,
F.S. Hage ,
D.M. Kepaptsoglou ,
P. Abellan ,
J. Yates ,
R.J. Nicholls ,
H.C. Nerl ,
V. Nicolosi ,
K. Winther  and
K. Thygesen
...Show all authors
Q.M. Ramasse
Affiliation:
SuperSTEM Laboratory, STFC Daresbury Campus, Keckwick Lane, Daresbury WA4 4AD, U.K.
F.S. Hage
Affiliation:
SuperSTEM Laboratory, STFC Daresbury Campus, Keckwick Lane, Daresbury WA4 4AD, U.K.
D.M. Kepaptsoglou
Affiliation:
SuperSTEM Laboratory, STFC Daresbury Campus, Keckwick Lane, Daresbury WA4 4AD, U.K.
P. Abellan
Affiliation:
SuperSTEM Laboratory, STFC Daresbury Campus, Keckwick Lane, Daresbury WA4 4AD, U.K.
J. Yates
Affiliation:
Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH, U.K.
R.J. Nicholls
Affiliation:
Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH, U.K.
H.C. Nerl
Affiliation:
CRANN & AMBER and School of Physics, Trinity College Dublin, Dublin 2, Ireland
V. Nicolosi
Affiliation:
CRANN & AMBER and School of Physics, Trinity College Dublin, Dublin 2, Ireland
K. Winther
Affiliation:
Center for Atomic-Scale Materials Design, Department of Physics, Technical University of Denmark, Fysikvej, 2800, Kgs. Lyngby, Denmark
K. Thygesen
Affiliation:
Center for Atomic-Scale Materials Design, Department of Physics, Technical University of Denmark, Fysikvej, 2800, Kgs. Lyngby, Denmark
P.Z. El Khoury
Affiliation:
Physical Sciences Division, Pacific Northwest National Laboratory, Richland, WA 99352, USA
W.P. Hess
Affiliation:
Physical Sciences Division, Pacific Northwest National Laboratory, Richland, WA 99352, USA
F. Azough
Affiliation:
School of Materials, Materials Science Centre, University of Manchester, Manchester M13 9PL, U.K.
R. Freer
Affiliation:
School of Materials, Materials Science Centre, University of Manchester, Manchester M13 9PL, U.K.

Abstract

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Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 964 - 965
Copyright
© Microscopy Society of America 2016 

References

[1] Krivanek, O.L., et al., Phil. Trans. Roy. Soc. 367 (2009). pp. 3683–3697. T.Miyata et al., Microscopy 5 (2014), pp. 377-382 ; O.L. Krivanek et al., Nature 514 (2014), pp. 209-212.Google Scholar
[2] Nicholls, R., et al., Microsc. Microanal. 21(Suppl.3 (2015). pp. 1469–1470.Google Scholar
[3] Pichler, T, et al., PRL 80 (1998) 4729.CrossRefGoogle Scholar
[4] Keller, D., et al., Microsc. Microanal 20 (1998). pp. 1246–1253.Google Scholar
[5] El Khoury, P.Z., et al., Submitted (2016).Google Scholar
[6] SuperSTEM is funded by the UK Engineering and Physical Sciences Research Council (EPSRC). Dr Rolf Erni and Ms. Debora Keller from the Electron Microscopy Center, Swiss Federal Laboratories for Materials Science and Technology, are gratefully acknowledged for a very fruitful collaboration on Cu(InGa)Se2 absorber layers which lead to some of the results presented here. PZE acknowledges support from the Laboratory Directed Research and Development Program at Pacific Northwest National Laboratory. WPH is supported by the US Department of Energy, Office of Science, Office of Basic Energy Sciences, Division of Chemical Sciences, Geosciences & Biosciences.Google Scholar