11 results
Thermal stability, microstructure, and electrical properties of atomic layer deposited Hf6Ta2O17 gate dielectrics
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- Journal:
- Journal of Materials Research / Volume 22 / Issue 10 / October 2007
- Published online by Cambridge University Press:
- 31 January 2011, pp. 2856-2862
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- October 2007
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High Contact-Resistance from Oxygen in Embedding ILD: An Investigation by TEM PEELS
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- Journal:
- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 1134-1135
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- August 2007
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Sample Preparation for Precise and Quantitative Electron Holography Analysis of Electrostatic Potential in Semiconductor Devices
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- Journal:
- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 586-587
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- August 2005
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Structural and Elemental Characterization of Fe/Co Nanoparticles Produced through Organometallic Synthesis
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- Journal:
- MRS Online Proceedings Library Archive / Volume 738 / 2002
- Published online by Cambridge University Press:
- 11 February 2011, G8.5
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- 2002
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Epitaxial Growth of AlN on Si Substrates with Intermediate 3C-SiC as Buffer Layers
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- Journal:
- MRS Online Proceedings Library Archive / Volume 572 / 1999
- Published online by Cambridge University Press:
- 10 February 2011, 407
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- 1999
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3C-SiC Buffer Layers Converted from Si at a Low Temperature
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- Journal:
- MRS Online Proceedings Library Archive / Volume 572 / 1999
- Published online by Cambridge University Press:
- 10 February 2011, 219
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- 1999
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A study of barium strontium titanate thin films for use in bypass capacitors
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- Journal:
- Journal of Materials Research / Volume 13 / Issue 1 / January 1998
- Published online by Cambridge University Press:
- 31 January 2011, pp. 197-204
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- January 1998
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Stoichiometric Effects of Sputtered Barium Strontium Titanate Films
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- Journal:
- MRS Online Proceedings Library Archive / Volume 493 / 1997
- Published online by Cambridge University Press:
- 10 February 2011, 21
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- 1997
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Chemical Imaging of InGaAs/InAiAs Quantum Wells
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- Journal:
- MRS Online Proceedings Library Archive / Volume 466 / 1996
- Published online by Cambridge University Press:
- 10 February 2011, 57
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- 1996
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Effects of Cu and Si Dopants on Electromigration Mass Transport in Al Interconnects for VLSI
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- Journal:
- MRS Online Proceedings Library Archive / Volume 403 / 1995
- Published online by Cambridge University Press:
- 15 February 2011, 507
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- 1995
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Oxygen Precipitation in Silicon - Its Effects on Minority Carrier Recombination and Generation Lifetime
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- Journal:
- MRS Online Proceedings Library Archive / Volume 14 / 1982
- Published online by Cambridge University Press:
- 15 February 2011, 187
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- 1982
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