19 results
Investigation of Nitrogen in Silicate Glasses and Iron Alloys by SXES
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 2024-2025
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- August 2018
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Damage-less Chemical State Analysis by Using Soft X-ray Emission Spectroscopy in Low Voltage SEM
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 1842-1843
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- July 2017
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Low Voltage X-ray Mapping: The Complementary Methods of the Oxford Instruments X-Max Extreme Windowless EDS Detector and the JEOL Soft X-Ray Emission Spectroscopy (SXES)
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 440-441
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- July 2016
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Chemical States Analysis of Trace-boron by using an Improved SEM-SXES
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
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- 25 July 2016, pp. 414-415
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- July 2016
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A New Compound Interferometer Operating at 160 MHz at Nobeyama
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- Publications of the Astronomical Society of Australia / Volume 1 / Issue 2 / November 1967
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- 25 April 2016, pp. 56-58
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Investigation of Mg-Li-Ca alloys using a Wavelength Dispersive Soft X-ray Emission Spectrometer and EPMA
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- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
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- 23 September 2015, pp. 2025-2026
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- August 2015
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Improving Analytical Spatial Resolution with the JEOL Field Emission Electron Microprobe
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 624-625
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- July 2011
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Regional spread of vanA- or vanB-positive Enterococcus gallinarum in hospitals and long-term care facilities in Kyoto prefecture, Japan
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- Epidemiology & Infection / Volume 139 / Issue 3 / March 2011
- Published online by Cambridge University Press:
- 01 June 2010, pp. 430-436
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Applications of the Field Emission Electron Probe Microanalyzer to Metals
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
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- 05 August 2007, pp. 168-169
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- August 2007
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Electron irradiation effect on thermal donors in CZ-Si
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- The European Physical Journal - Applied Physics / Volume 27 / Issue 1-3 / July 2004
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- 15 July 2004, pp. 133-135
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- July 2004
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Novel techniques for image process in electron probe microanalysis
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- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
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- 01 August 2002, pp. 488-489
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- August 2002
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Unitary equivalence of unbounded *-representations of *-algebras
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- Mathematical Proceedings of the Cambridge Philosophical Society / Volume 122 / Issue 2 / September 1997
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- 01 September 1997, pp. 269-279
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- September 1997
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Application of Epma Area Analysis To Thickness Measurement of Thin-Films
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- Microscopy and Microanalysis / Volume 3 / Issue S2 / August 1997
- Published online by Cambridge University Press:
- 02 July 2020, pp. 895-896
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- August 1997
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Structural and Electrical Characterization of U Ltra-Thin SiO2 Grown on Hydrogen-Terminated Silicon Surfaces
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- MRS Online Proceedings Library Archive / Volume 315 / 1993
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- 21 February 2011, 367
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- 1993
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Cleaning and Oxidation of Heavily Doped Si Surfaces
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- MRS Online Proceedings Library Archive / Volume 259 / 1992
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- 25 February 2011, 385
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- 1992
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Chemical Structure of Native Oxide Grown on Hydrogenterminated Silicon Surfaces
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- MRS Online Proceedings Library Archive / Volume 259 / 1992
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- 25 February 2011, 113
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- 1992
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Layer-by-Layer Oxidation of Silicon
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- MRS Online Proceedings Library Archive / Volume 222 / 1991
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- 16 February 2011, 225
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- 1991
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a-Si Basis Heterojunction Stacked Solar Cells
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- MRS Online Proceedings Library Archive / Volume 70 / 1986
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- 28 February 2011, 481
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- 1986
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