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Investigation of Mg-Li-Ca alloys using a Wavelength Dispersive Soft X-ray Emission Spectrometer and EPMA

Published online by Cambridge University Press:  23 September 2015

H. Takahashi ,
M. Takakura ,
T. Murano ,
M. Terauchi ,
M. Yamasaki ,
Y. Kawamura  and
P. McSwiggen
H. Takahashi
Affiliation:
Global business promotion division, JEOL Ltd., 13F, Otemachi Nomura Bld. 2-1-1 Otemachi, Qhyoda-ku, Tokyo, 100-0004 Japan
M. Takakura
Affiliation:
.SM business unit JEOL Ltd., 1-2 Musashno, 3-chome, Akishima, Tokyo 196-8558, Japan.
T. Murano
Affiliation:
.SM business unit JEOL Ltd., 1-2 Musashno, 3-chome, Akishima, Tokyo 196-8558, Japan.
M. Terauchi
Affiliation:
Institute for MMultidisciplinary Research for Advanced Materials, Tohoku University, Sendai 980-8577, Japan.
M. Yamasaki
Affiliation:
.Magnesium Research Center, Kumamoto University, 39-1, 2-chome, Kurokami, Chou-ku, Kumamoto, 860-8555, Japan.
Y. Kawamura
Affiliation:
.Magnesium Research Center, Kumamoto University, 39-1, 2-chome, Kurokami, Chou-ku, Kumamoto, 860-8555, Japan.
P. McSwiggen
Affiliation:
.JEOL USA, 11 Dearborn Rd. Peabody, MA 01960, USA.

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 2025 - 2026
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Terauchi, M., et al., J. Electron Microscopy 61, 1 (2012).Google Scholar
[2] Imazono, T., et al., Appl. Opt. 51, 2351 (2012).CrossRefGoogle Scholar
[3] Takahashi, H., et al., Microscopy and Microanalysis, 19(supple. 2, 1258 (2013).Google Scholar
[4] Fabian, D. J. "Soft X-ray band and electric structure" 62, (1968). Acade. Press.Google Scholar