15 results
Development of the Silicon Drift Detector for Electron Microscopy Applications
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- Journal:
- Microscopy Today / Volume 28 / Issue 5 / September 2020
- Published online by Cambridge University Press:
- 25 September 2020, pp. 46-53
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- September 2020
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News on Silicon Drift Detectors for High Resolution EDX Imaging and Spectroscopy
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 516-517
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- August 2019
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Pushing the Measuring Capabilities of Silicon Drift Detectors for EDX Imaging of Low-Z Materials Down to Lithium
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 1768-1769
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- August 2019
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Detection of Low Energy X-rays with High Efficiency and Spectral Resolution
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 272-273
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- August 2019
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Measuring Single Electrons – What Does it Mean?
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 1654-1655
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- August 2019
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Micro-Focused Five Dimensional X-ray Imaging with the Color X-ray Camera
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
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- 01 August 2018, pp. 986-987
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- August 2018
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X-ray Detectors - in Heaven and on Earth
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 990-991
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- August 2018
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A New Approach: Quantitative Imaging Spectrometry for Iron Oxide Analysis
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- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
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- 01 August 2018, pp. 784-785
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- August 2018
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Spatial Resolution Smaller Than the Pixel Size? Yes we can!
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 90-91
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- July 2017
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Processing a Five Dimensional X-ray Image: Big Data Challenges and Opportunities
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 200-201
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- July 2017
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Measurement of Atomic Electric Fields by Scanning Transmission Electron Microscopy (STEM) Employing Ultrafast Detectors
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 484-485
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- July 2016
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Analysis of Polymorphs Using Simultaneous X-ray Fluorescence and Diffraction with an Imaging Spectrometer
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
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- 25 July 2016, pp. 102-103
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- July 2016
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Characterization and Comparison of Detector Systems for Large Area X-ray Imaging
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- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1637-1638
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- August 2015
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The pnCCD for Applications in Transmission Electron Microscopy: Further Development and New Operation Modes
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
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- 27 August 2014, pp. 1122-1123
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- August 2014
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Silicon Drift Detectors for Fast and High Resolution Element Detection in Micro-Beam Analysis
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- Journal:
- Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
- Published online by Cambridge University Press:
- 01 August 2004, pp. 1046-1047
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- August 2004
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