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Measurement of Atomic Electric Fields by Scanning Transmission Electron Microscopy (STEM) Employing Ultrafast Detectors

Published online by Cambridge University Press:  25 July 2016

Knut Müller-Caspary
Affiliation:
IFP, Universität Bremen, Otto-Hahn-Allee 1, 28359 Bremen, Germany
Florian F. Krause
Affiliation:
IFP, Universität Bremen, Otto-Hahn-Allee 1, 28359 Bremen, Germany
Armand Béché
Affiliation:
EMAT, Universiteit Antwerpen, Groenenborgerlaan 171, B-2020, Belgium
Martial Duchamp
Affiliation:
ER-C and PGI, Forschungszentrum Jülich, 52428 Jülich, Germany
Marco Schowalter
Affiliation:
IFP, Universität Bremen, Otto-Hahn-Allee 1, 28359 Bremen, Germany
Stefan Löffler
Affiliation:
Inst. Of Solid State Physics, TU Wien & USTEM, Wiedner Hauptstr. 8-10, A-1040 Vienna, Austria
Vadim Migunov
Affiliation:
ER-C and PGI, Forschungszentrum Jülich, 52428 Jülich, Germany
Florian Winkler
Affiliation:
ER-C and PGI, Forschungszentrum Jülich, 52428 Jülich, Germany
Martin Huth
Affiliation:
PNSensor GmbH, 81739 München, Germany and PNDetector GmbH, 81667 München, Germany
Robert Ritz
Affiliation:
PNSensor GmbH, 81739 München, Germany and PNDetector GmbH, 81667 München, Germany
Sebastian Ihle
Affiliation:
PNSensor GmbH, 81739 München, Germany and PNDetector GmbH, 81667 München, Germany
Martin Simson
Affiliation:
PNSensor GmbH, 81739 München, Germany and PNDetector GmbH, 81667 München, Germany
Henning Ryll
Affiliation:
PNSensor GmbH, 81739 München, Germany and PNDetector GmbH, 81667 München, Germany
Heike Soltau
Affiliation:
PNSensor GmbH, 81739 München, Germany and PNDetector GmbH, 81667 München, Germany
Lothar Strüder
Affiliation:
PNSensor GmbH, 81739 München, Germany and PNDetector GmbH, 81667 München, Germany
Josef Zweck
Affiliation:
Universität Regensburg, Universitätsstr. 31, 93040 Regensburg, Germany
Peter Schattschneider
Affiliation:
Inst. Of Solid State Physics, TU Wien & USTEM, Wiedner Hauptstr. 8-10, A-1040 Vienna, Austria
Rafal Dunin-Borkowski
Affiliation:
ER-C and PGI, Forschungszentrum Jülich, 52428 Jülich, Germany
Johan Verbeeck
Affiliation:
EMAT, Universiteit Antwerpen, Groenenborgerlaan 171, B-2020, Belgium
Andreas Rosenauer
Affiliation:
IFP, Universität Bremen, Otto-Hahn-Allee 1, 28359 Bremen, Germany
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Abstract

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Copyright
© Microscopy Society of America 2016 

References

[1] Chapman, J., et al., Ultramicroscopy 3 (1978). p. 203214.CrossRefGoogle Scholar
[2] Shibata, N., et al., Nat. Phys 8 (2012) 611.CrossRefGoogle Scholar
[3] Müller, K., et al., Nat. Commun 5 (2014) 5653.CrossRefGoogle Scholar
[4] Müller, K., et al., Appl. Phys. Lett 101 (2012) 212110.CrossRefGoogle Scholar
[5] Funding: DFG (MU3660/1-1, RO2057/8-1), ERC (FP7, 278510), FWF (J3732-N27, I543-N20).Google Scholar
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Measurement of Atomic Electric Fields by Scanning Transmission Electron Microscopy (STEM) Employing Ultrafast Detectors
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