20 results
Reference diffraction patterns, microstructure, and pore-size distribution for the copper (II) benzene-1,3,5-tricarboxylate metal organic framework (Cu-BTC) compounds – CORRIGENDUM
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- Powder Diffraction / Volume 30 / Issue 3 / September 2015
- Published online by Cambridge University Press:
- 07 May 2015, p. 323
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Review of Molecular Modeling of Clays and Mineral Surfaces
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- Powder Diffraction / Volume 19 / Issue 4 / December 2004
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- 05 March 2012, p. 392
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Structural Study of Amorphous CoFeB Magnetic Thin Films by Electron Diffraction
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 1806-1807
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- July 2010
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High Resolution Imaging Using the Oxford Aberration Corrected TEM.
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
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- 31 July 2006, pp. 1454-1455
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- August 2006
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HAADF Studies of the Si3N4 IGF Interface
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
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- 31 July 2006, pp. 136-137
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- August 2006
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Three-dimensional Arrangement of Rare-earth Atoms at Grain Boundaries in Silicon Nitride Ceramics Using Aberration-Corrected HAADF-STEM
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- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 206-207
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- August 2005
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Structural Refinement of Amorphous Alloy Nanovolumes Using RDF Analysis
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- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 1542-1543
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- August 2005
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Study of Medium-range Order in Amorphous Carbon by Efficient ab-initio Tight-Binding Technique
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- Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
- Published online by Cambridge University Press:
- 01 August 2004, pp. 818-819
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- August 2004
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A New Double-Corrected HREM/STEM and its Applications for Advanced Materials
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- Microscopy and Microanalysis / Volume 10 / Issue S03 / August 2004
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- 01 August 2004, pp. 8-9
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- August 2004
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Cs Corrector for Imaging
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- Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
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- 01 August 2004, pp. 976-977
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- August 2004
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Cs Corrector for Illumination
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- Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
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- 01 August 2004, pp. 1004-1005
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- August 2004
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Strain Relaxation Mechanisms in Coherent and Incoherent Ge(Si)/Si Islands
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- Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
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- 22 July 2003, pp. 472-473
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- August 2003
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TEM Investigations of the Compositions in Ge(Si)/Si(001) Quantum Dots
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- Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
- Published online by Cambridge University Press:
- 19 July 2003, pp. 426-427
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- August 2003
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Characterization of Amorphous Materials by Electron Diffraction and Atomistic Modeling
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- Microscopy and Microanalysis / Volume 6 / Issue 4 / July 2000
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- 07 August 2002, pp. 329-334
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- July 2000
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Al Compositional Profile In Algaas/Gaas Quantum Wells
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- Microscopy and Microanalysis / Volume 5 / Issue S2 / August 1999
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- 02 July 2020, pp. 168-169
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- August 1999
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Characterisation of Amorphous Materials By Electron Diffraction and Atomistic Modelling
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- Microscopy and Microanalysis / Volume 5 / Issue S2 / August 1999
- Published online by Cambridge University Press:
- 02 July 2020, pp. 684-685
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- August 1999
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Transmission Electron Microscopy Study of Ingaas/Gaas Structural Evolution Near the Stranski-Krastanow Transformation
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- MRS Online Proceedings Library Archive / Volume 570 / 1999
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- 10 February 2011, 175
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- 1999
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Ion Irradiation of GeSi/Si Strained-Layer Heterostructures
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- MRS Online Proceedings Library Archive / Volume 540 / 1998
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- 15 February 2011, 55
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- 1998
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The Effect Of Ion-Implantation Induced Defects On Strain Relaxation In GexSi1−x/Si Heterostuctures
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- MRS Online Proceedings Library Archive / Volume 442 / 1996
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- 15 February 2011, 367
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- 1996
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Properties of Hereditary Hypergraphs and Middle Graphs
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- Canadian Mathematical Bulletin / Volume 21 / Issue 4 / 01 December 1978
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- 20 November 2018, pp. 461-468
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- 01 December 1978
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