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A New Double-Corrected HREM/STEM and its Applications for Advanced Materials

Published online by Cambridge University Press:  01 August 2004

J. L. Hutchison ,
J. M. Titchmarsh ,
D. J. H. Cockayne ,
C. J. D. Hetherington ,
A. I. Kirkland ,
R. M. Doole  and
H. Sawada
J. L. Hutchison
Affiliation:
University of Oxford, United Kingdom
J. M. Titchmarsh
Affiliation:
University of Oxford, United Kingdom
D. J. H. Cockayne
Affiliation:
University of Oxford, United Kingdom
C. J. D. Hetherington
Affiliation:
University of Oxford, United Kingdom
A. I. Kirkland
Affiliation:
University of Oxford, United Kingdom
R. M. Doole
Affiliation:
University of Oxford, United Kingdom
H. Sawada
Affiliation:
JEOL, Ltd., Akishima, Japan
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Extract

Extended abstract of a paper presented at the Pre-Meeting Congress: Materials Research in an Aberration-Free Environment, at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, July 31 and August 1, 2004.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 10 , Issue S03 , August 2004 , pp. 8 - 9
Copyright
© 2004 Microscopy Society of America

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