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A New Double-Corrected HREM/STEM and its Applications for Advanced Materials

  • J. L. Hutchison (a1), J. M. Titchmarsh (a1), D. J. H. Cockayne (a1), C. J. D. Hetherington (a1), A. I. Kirkland (a1), R. M. Doole (a1) and H. Sawada (a2)...

Extract

Extended abstract of a paper presented at the Pre-Meeting Congress: Materials Research in an Aberration-Free Environment, at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, July 31 and August 1, 2004.

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