6 results
Insights into Texture and Phase Coexistence in Polycrystalline and Polyphasic Ferroelectric HfO2 Thin Films using 4D-STEM
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 184-185
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- August 2018
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Imaging 180° Polarization Reversal in Ferroelectric Oxides with Electron Backscatter Diffraction
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 1822-1823
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- July 2016
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Domain Structure of Bulk and Thin-Film Ferroelectrics By Transmission Kikuchi Diffraction
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- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 777-778
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- August 2015
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Accurate Nanoscale Crystallography in Real-Space Using Scanning Transmission Electron Microscopy
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- Microscopy and Microanalysis / Volume 21 / Issue 4 / August 2015
- Published online by Cambridge University Press:
- 14 July 2015, pp. 946-952
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- August 2015
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In situ characterization of polycrystalline ferroelectrics using x-ray and neutron diffraction – ERRATUM
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- Journal of Materials Research / Volume 30 / Issue 3 / 14 February 2015
- Published online by Cambridge University Press:
- 17 February 2015, p. 451
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- 14 February 2015
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In situ characterization of polycrystalline ferroelectrics using x-ray and neutron diffraction
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- Journal:
- Journal of Materials Research / Volume 30 / Issue 3 / 14 February 2015
- Published online by Cambridge University Press:
- 03 November 2014, pp. 340-356
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- 14 February 2015
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