5 results
Low Energy 500 eV Focused Argon Ion Beam Provided by Multi-Ions Species Plasma FIB for Material Science Sample Preparations
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- Journal:
- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 20-22
- Print publication:
- August 2021
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SIMS Detector on FIB/SEM DualBeam Microscopes for Material Science Applications
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 408-409
- Print publication:
- August 2020
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Three-Dimensional Time-of-Flight Secondary Ion Mass Spectrometry and DualBeam FIB/SEM Imaging of Lithium-ion Battery Cathode
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 876-877
- Print publication:
- August 2019
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Liftout of High-Quality Thin Sections of a Perovskite Oxide Thin Film Using a Xenon Plasma Focused Ion Beam Microscope
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue 1 / February 2019
- Published online by Cambridge University Press:
- 30 January 2019, pp. 115-118
- Print publication:
- February 2019
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New Concepts for 3D Optics in X-ray Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S2 / August 2018
- Published online by Cambridge University Press:
- 10 August 2018, pp. 288-289
- Print publication:
- August 2018
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