53 results
An Ultrafast Direct Electron Camera for 4D STEM
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- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 1004-1006
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- August 2021
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Optimizing Nonrigid Registration for Scanning Transmission Electron Microscopy Image Series
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- Microscopy and Microanalysis / Volume 27 / Issue 1 / February 2021
- Published online by Cambridge University Press:
- 23 November 2020, pp. 90-98
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- February 2021
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Structure of TiN/CrN Interface in Nanolaminate Coatings with Enhanced Mechanical and Tribological Properties
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 2278-2279
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- August 2019
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Bayesian Statistical Model for Imaging of Single La Vacancies in LaMnO3
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
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- 04 August 2017, pp. 1572-1573
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- July 2017
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Three-Dimensional Imaging of Single La Vacancies in LaMnO3
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 902-903
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- July 2016
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High-precision stress mapping and defect characterization of thin films of LaMnO3grown on DyScO3substrate.
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 1526-1527
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- July 2016
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Revealing New Atomic-scale Information about Materials by Improving the Quality and Quantifiability of Aberration-corrected STEM Data
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- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 2409-2410
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- August 2015
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Prospects for Detecting Single Vacancies by Quantitative Scanning Transmission Electron Microscopy
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- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
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- 23 September 2015, pp. 1887-1888
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- August 2015
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Increased Fluctuation of Interatomic Distances in Distorted Structure of Stoichiometric LaMnO3
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- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 2413-2414
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- August 2015
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Thickness Variations and Absence of Lateral Compositional Fluctuations in Aberration-Corrected STEM Images of InGaN LED Active Regions at Low Dose
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- Microscopy and Microanalysis / Volume 20 / Issue 3 / June 2014
- Published online by Cambridge University Press:
- 26 March 2014, pp. 864-868
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- June 2014
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Head-to-head Inversion Domain Boundaries in Sb-doped p-type ZnO Nanowires
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 316-317
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- July 2012
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Structural and Elemental Analysis of Heavily- Doped ZnO
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 392-393
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- July 2012
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Absence of Lateral Composition Fluctuations in Aberration-corrected STEM Images of an InGaN Quantum Well at Low Dose
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- MRS Online Proceedings Library Archive / Volume 1432 / 2012
- Published online by Cambridge University Press:
- 16 May 2012, mrss12-1432-g04-03
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- 2012
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Indium Composition Variation in Nominally Uniform InGaN Layers Discovered by Aberration-Corrected Z-contrast STEM
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 1386-1387
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- July 2011
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Effect of Growth Conditions on Electronic and Structural Properties of GZO Films Grown by Plasma-enhanced Molecular Beam Epitaxy on p-GaN(0001)/Sapphire Templates
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- MRS Online Proceedings Library Archive / Volume 1315 / 2011
- Published online by Cambridge University Press:
- 04 April 2011, mrsf10-1315-mm09-03
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- 2011
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Effect of Growth Conditions on Structural and Electrical Properties of Ga-doped ZnO Films Grown by Plasma-assisted MBE
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- MRS Online Proceedings Library Archive / Volume 1201 / 2009
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- 31 January 2011, 1201-H05-20
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- 2009
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Growth, characterization, and electrical properties of PbZr0.52Ti0.48O3 thin films on buffered silicon substrates using pulsed laser deposition
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- Journal of Materials Research / Volume 18 / Issue 1 / January 2003
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- 31 January 2011, pp. 111-114
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- January 2003
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Radiation Damage Characterization in Ar+ Implanted GaN
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- MRS Online Proceedings Library Archive / Volume 792 / 2003
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- 01 February 2011, R9.4
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- 2003
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Transmission Electron Miscroscopy Study of the Fused Silicon/Diamond Interface
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- MRS Online Proceedings Library Archive / Volume 768 / 2003
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- 02 August 2011, G2.9
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- 2003
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The Refractive Index and Other Properties of Doped ZnO films
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- MRS Online Proceedings Library Archive / Volume 764 / 2003
- Published online by Cambridge University Press:
- 01 February 2011, C3.21
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- 2003
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