4 results
Temperature-dependent Optical Properties of AlN Thin Films by Spectroscopy Ellipsometry
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- Journal:
- MRS Advances / Volume 2 / Issue 5 / 2017
- Published online by Cambridge University Press:
- 13 February 2017, pp. 323-328
- Print publication:
- 2017
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Al2O3 as a Transition Layer for GaN and InGaN Growth on ZnO by MOCVD
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1201 / 2009
- Published online by Cambridge University Press:
- 31 January 2011, 1201-H06-02
- Print publication:
- 2009
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Spectroscopic Ellipsometry Studies of Tb-doped SiO2 Thin Films
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- Journal:
- MRS Online Proceedings Library Archive / Volume 997 / 2007
- Published online by Cambridge University Press:
- 01 February 2011, 0997-I07-14
- Print publication:
- 2007
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- Article
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Investigation of molecular co-doping for low ionization energy p-type centers in (Ga,Al)N
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- Journal:
- MRS Online Proceedings Library Archive / Volume 798 / 2003
- Published online by Cambridge University Press:
- 01 February 2011, Y10.44
- Print publication:
- 2003
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