1 results
Reliability of Oxide Thin Film Transistors under the Gate Bias Stress with 400 nm Wavelength Light Illumination
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 1321 / 2011
- Published online by Cambridge University Press:
- 27 June 2011, mrss11-1321-a19-08
- Print publication:
- 2011
-
- Article
- Export citation