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4D Analytical STEM with the pnCCD
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 220-221
- Print publication:
- August 2018
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Pushing the Limits of Fast Acquisition in TEM Tomography and 4D-STEM
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 512-513
- Print publication:
- July 2016
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In-situ Low Energy Argon Ion Milling of Nanoelectronic Structures Using a Triple Beam System
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- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 170-171
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- July 2009
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TEM Sample Preparation Using Focused Ion Beam - Capabilities And Limits
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- Journal:
- Microscopy Today / Volume 11 / Issue 2 / April 2003
- Published online by Cambridge University Press:
- 14 March 2018, pp. 22-25
- Print publication:
- April 2003
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