10 results
Powder diffraction data and Rietveid refinement of the compound Ba2Cl2Cu3O4
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- Powder Diffraction / Volume 10 / Issue 4 / December 1995
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- 10 January 2013, pp. 282-287
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The influence of surface roughness on diffracted X-ray intensities in Bragg–Brentano geometry and its effect on the structure determination by means of Rietveld analysis
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- Powder Diffraction / Volume 8 / Issue 2 / June 1993
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- 10 January 2013, pp. 74-83
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Incorporation of microabsorption corrections into Rietveid analysis
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- Powder Diffraction / Volume 8 / Issue 4 / December 1993
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- 10 January 2013, pp. 223-228
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High temperature X-ray diffraction studies of the decomposition mechanism of YBa2Cu3O7−δ at an oxygen partial pressure less than 10 Pa
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- Powder Diffraction / Volume 10 / Issue 3 / September 1995
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- 10 January 2013, pp. 165-169
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Powder diffraction data and Rietveld refinement for Y-doped (ZnO)5In2O3
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- Powder Diffraction / Volume 14 / Issue 3 / September 1999
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- 10 January 2013, pp. 213-218
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Abnormal grain growth of sputtered CuNi(Mn) thin films
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- Journal of Materials Research / Volume 15 / Issue 5 / May 2000
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- 31 January 2011, pp. 1062-1068
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- May 2000
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Structure and thermoelectric properties of binary and Fe-doped iridium silicide thin films
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- Journal of Materials Research / Volume 15 / Issue 3 / March 2000
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- 31 January 2011, pp. 772-782
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- March 2000
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Mechanical Stress, Grain-boundary Relaxation, and Oxidation of Sputtered CuNi(Mn) Films
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- Journal of Materials Research / Volume 14 / Issue 4 / April 1999
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- 31 January 2011, pp. 1286-1294
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- April 1999
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Young's modulus and tensile strength of CuNi(Mn) thin films on polyimide foils by tensile testing
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- Journal of Materials Research / Volume 13 / Issue 10 / October 1998
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- 31 January 2011, pp. 2852-2858
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- October 1998
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Development of Mechanical Stress in Cuni(mn) Films During Temperature Ramping: Related Mechanisms
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- MRS Online Proceedings Library Archive / Volume 505 / 1997
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- 10 February 2011, 397
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- 1997
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