13 results
Advantages of Low-kV TEM in the Study of Beam Sensitive Materials
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 554-555
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- August 2020
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Semiconductor and Soft Material Analysis with Low-kV TEM
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 456-457
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- August 2019
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Toward Quantitative Bright Field TEM Imaging of Ultra Thin Samples
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- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 1612-1613
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- August 2018
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Development and Application of a Sample Holder for In Situ Gaseous TEM Studies of Membrane Electrode Assemblies for Polymer Electrolyte Fuel Cells
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue 5 / October 2017
- Published online by Cambridge University Press:
- 30 August 2017, pp. 945-950
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- October 2017
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Development of TEM techniques dedicated for characterization of energy related composites and its application
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- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1817-1818
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- August 2015
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In situ observation of degradation of electrocatalysts in humidified air atmosphere using a cold FE 60-300 kV ETEM
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- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 245-246
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- August 2015
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A FIB Micro-Sampling Technique for Three-Dimensional Characterization of a Site-Specific Defect
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- Journal:
- Microscopy Today / Volume 12 / Issue 6 / November 2004
- Published online by Cambridge University Press:
- 14 March 2018, pp. 26-29
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- November 2004
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Direct 3D (S)TEM Observation at Specific-site and High Resolution Using a FIB Micro-sampling Technique
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- Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
- Published online by Cambridge University Press:
- 01 August 2004, pp. 1164-1165
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- August 2004
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3D Elemental Mapping Using a Dedicated FIB/STEM System
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- Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
- Published online by Cambridge University Press:
- 01 August 2004, pp. 1030-1031
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- August 2004
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Method for Cross-sectional Thin Specimen Preparation from a Specific Site Using a Combination of a Focused Ion Beam System and Intermediate Voltage Electron Microscope and Its Application to the Characterization of a Precipitate in a Steel
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- Journal:
- Microscopy and Microanalysis / Volume 7 / Issue 3 / May 2001
- Published online by Cambridge University Press:
- 02 February 2002, pp. 287-291
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- May 2001
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Cross-sectional Specimen Preparation and Observation of a Plasma Sprayed Coating Using a Focused Ion Beam/Transmission Electron Microscopy System
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- Microscopy and Microanalysis / Volume 6 / Issue 3 / May 2000
- Published online by Cambridge University Press:
- 29 January 2003, pp. 218-223
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- May 2000
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A FIB Micro-Sampling Technique and a Site-Specific TEM Specimen Preparation Method for Precision Materials Characterization
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- MRS Online Proceedings Library Archive / Volume 636 / 2000
- Published online by Cambridge University Press:
- 17 March 2011, D9.35.1
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- 2000
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Method for Cross-sectional Transmission Electron Microscopy Specimen Preparation of Composite Materials Using a Dedicated Focused Ion Beam System
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- Microscopy and Microanalysis / Volume 5 / Issue 5 / September 1999
- Published online by Cambridge University Press:
- 08 August 2002, pp. 365-370
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- September 1999
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