3 results
Extending XPS Surface Analysis with Correlative Spectroscopy and Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, p. 1016
- Print publication:
- August 2020
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Improvements in Characterization of FIB Prepared Surfaces of Aluminum Using Xe+ Plasma FIB
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 272-273
- Print publication:
- July 2017
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Ga+ and Xe+ FIB Milling and Measurement of FIB Damage in Aluminum
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 296-297
- Print publication:
- July 2017
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