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Extending XPS Surface Analysis with Correlative Spectroscopy and Microscopy
Published online by Cambridge University Press: 30 July 2020
Abstract
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- Type
- Surface and Subsurface Microscopy and Microanalysis of Physical and Biological Specimens - Featured Multitechnique Methods and Beamline Analysis
- Information
- Copyright
- Copyright © Microscopy Society of America 2020
References
Abou-Ras, D., Caballero, R., Fischer, C., Kaufmann, C., Lauermann, I., Mainz, R., Kötschau, . . ., I. (2011). Comprehensive Comparison of Various Techniques for the Analysis of Elemental Distributions in Thin Films. Microscopy and Microanalysis, 17(5), 728–751. doi:10.1017/S1431927611000523CrossRefGoogle ScholarPubMed