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D095 High resolution X-ray diffractometry and reflectometry in modern semiconductor manufacturing—invited
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- Journal:
- Powder Diffraction / Volume 21 / Issue 2 / June 2006
- Published online by Cambridge University Press:
- 20 May 2016, p. 174
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An X-Ray Diffraction Analysis of the Patina of the Statue of Liberty
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- Journal:
- Powder Diffraction / Volume 1 / Issue 4 / December 1986
- Published online by Cambridge University Press:
- 10 January 2013, pp. 299-304
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High Resolution X-Ray Diffraction Analysis Of Gallium Nitride Grown On Sapphire By Halide Vapor Phase Epitaxy
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- Journal:
- MRS Online Proceedings Library Archive / Volume 423 / 1996
- Published online by Cambridge University Press:
- 15 February 2011, 239
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- 1996
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Nucleation and Growth of Gallium Nitride Films on Si and Sapphire Substrates Using Buffer Layers
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- MRS Online Proceedings Library Archive / Volume 423 / 1996
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- 15 February 2011, 287
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- 1996
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Epitaxial Layer Misorientation in CdTe on GaAs‡
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- MRS Online Proceedings Library Archive / Volume 202 / 1990
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- 25 February 2011, 543
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- 1990
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Microstructural Characterization of GaAs Substrates
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- Journal:
- MRS Online Proceedings Library Archive / Volume 69 / 1986
- Published online by Cambridge University Press:
- 25 February 2011, 379
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- 1986
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Compound Formation And Silicon Behavior In Titanium And Tantalum Layered Aluminum Films
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- MRS Online Proceedings Library Archive / Volume 54 / 1985
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- 26 February 2011, 103
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- 1985
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Characterization of Tungsten Silicide and Titanium Silicide Thin Films With a Fully-Automated See Mann-Bohlin Diffractometer
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- Journal:
- Advances in X-ray Analysis / Volume 29 / 1985
- Published online by Cambridge University Press:
- 06 March 2019, pp. 375-380
- Print publication:
- 1985
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