6 results
A New Detection Metric for EDS Detectors
-
- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 1064-1065
- Print publication:
- July 2017
-
- Article
-
- You have access
- Export citation
Scientific Analysis of NPAR Processing of EBSD Results for Beam-Sensitive Materials
-
- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 1836-1837
- Print publication:
- July 2017
-
- Article
-
- You have access
- Export citation
Improved EBSD Map Fidelity through Re-indexing of Neighbor Averaged Patterns
-
- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 2373-2374
- Print publication:
- August 2015
-
- Article
-
- You have access
- Export citation
Complete Identification using Spectral Imaging, Compass, and Phaseid
-
- Journal:
- Microscopy and Microanalysis / Volume 7 / Issue S2 / August 2001
- Published online by Cambridge University Press:
- 02 July 2020, pp. 886-887
- Print publication:
- August 2001
-
- Article
- Export citation
Considerations for Multi-Phase and Low-Symmetry Com Analyses
-
- Journal:
- Microscopy and Microanalysis / Volume 7 / Issue S2 / August 2001
- Published online by Cambridge University Press:
- 02 July 2020, pp. 362-363
- Print publication:
- August 2001
-
- Article
- Export citation
Local Electrode Atom Probes
-
- Journal:
- Microscopy and Microanalysis / Volume 4 / Issue S2 / July 1998
- Published online by Cambridge University Press:
- 02 July 2020, pp. 84-85
- Print publication:
- July 1998
-
- Article
- Export citation