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Scientific Analysis of NPAR Processing of EBSD Results for Beam-Sensitive Materials

Published online by Cambridge University Press:  04 August 2017

Patrick P. Camus ,
Stuart I. Wright ,
Matthew M. Nowell  and
Rene de Kloe
Patrick P. Camus
Affiliation:
EDAX Inc., 91 McKee Place, Mahwah, NJ 07430USA
Stuart I. Wright
Affiliation:
EDAX Inc., 91 McKee Place, Mahwah, NJ 07430USA
Matthew M. Nowell
Affiliation:
EDAX Inc., 91 McKee Place, Mahwah, NJ 07430USA
Rene de Kloe
Affiliation:
Ametek BV, PO Box 4144, 5004JC Tilburg, The Netherlands

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 1836 - 1837
Copyright
© Microscopy Society of America 2017 

References

[1] Wright, S. & Nowell, M. (2008). Advanced Materials and Processes. 166, 29–31.Google Scholar
[2] Wright, S. I. (2006). Materials Science and Technology 22(11), 1287–1296.Google Scholar
[3] Wright, S. I., Nowell, M. M., Lindeman, S. P., Camus, P. P., De Graef, M. & Jackson, M. A. (2015). Ultramicroscopy 159, 81–94.Google Scholar
[4] Specimen courtesy of E. Griesshaber, Geo- und Umweltwisschaften, Ludwig-Maximilians-Universitat Munchen.Google Scholar