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A New Automated Method for Fast and Reliable Tilt-Series Acquisition in Electron Tomography
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- Journal:
- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
- Published online by Cambridge University Press:
- 01 August 2002, pp. 792-793
- Print publication:
- August 2002
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3-D Electron Microscopy for Nano-Technology and the IC Industry
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- Journal:
- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
- Published online by Cambridge University Press:
- 01 November 2002, pp. 1104-1105
- Print publication:
- August 2002
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- Article
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- You have access
- Export citation