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A New Automated Method for Fast and Reliable Tilt-Series Acquisition in Electron Tomography

Published online by Cambridge University Press:  01 August 2002

C. Kübel ,
W.F. Voorhout ,
A.G. van Balen ,
D. Hubert  and
M.T. Otten
C. Kübel
Affiliation:
FEI Company, Application Laboratory, P.O. Box 80066, 5600 KA Eindhoven, The Netherlands

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 792 - 793
Copyright
Copyright © Microscopy Society of America 2002