4 results
Characterization of Microlens Structures Fabricated in Cd1-xZnxTe and Cdte/Si IRFPA Substrate Materials
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- Journal:
- Microscopy and Microanalysis / Volume 7 / Issue S2 / August 2001
- Published online by Cambridge University Press:
- 02 July 2020, pp. 570-571
- Print publication:
- August 2001
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Growth of Improved GaAs/Si: Suppression of Volmer-Weber Nucleation for Reduced Threading Dislocation Density
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- Journal:
- MRS Online Proceedings Library Archive / Volume 535 / 1998
- Published online by Cambridge University Press:
- 10 February 2011, 39
- Print publication:
- 1998
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Spectroscopic Ellipsometry Study of HgCdTe Epilayer Surfaces During Electron Cyclotron Resonance Plasma Etching
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- Journal:
- MRS Online Proceedings Library Archive / Volume 450 / 1996
- Published online by Cambridge University Press:
- 10 February 2011, 293
- Print publication:
- 1996
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Selected-Area Epitaxy of CdTe on GaAs with A Cantilever Shadow Mask
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- Journal:
- MRS Online Proceedings Library Archive / Volume 263 / 1992
- Published online by Cambridge University Press:
- 25 February 2011, 359
- Print publication:
- 1992
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