44 results
Comparison Between Deep Learning and Iterative Bayesian Statistics Deconvolution Methods in Energy Electron Loss Spectroscopy
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 3154-3156
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- August 2022
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EELSpecNet: Deep Convolutional Neural Network Solution for Electron Energy Loss Spectroscopy Deconvolution
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- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 1626-1627
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- August 2021
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Single-shot electrons and protons time-resolved detection from high-intensity laser–solid matter interactions at SPARC_LAB
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- High Power Laser Science and Engineering / Volume 7 / 2019
- Published online by Cambridge University Press:
- 15 August 2019, e53
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Environmental contaminants and child’s growth
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- Journal of Developmental Origins of Health and Disease / Volume 9 / Issue 6 / December 2018
- Published online by Cambridge University Press:
- 05 February 2019, pp. 632-641
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Femtosecond laser-induced damage threshold in snow micro-structured targets
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- High Power Laser Science and Engineering / Volume 6 / 2018
- Published online by Cambridge University Press:
- 19 March 2018, e7
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Understanding Properties of Functional Materials with Atomic-Resolved Electron Energy Loss Spectroscopy
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
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- 04 August 2017, pp. 364-365
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- July 2017
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Primary instability of a shear-thinning film flow down an incline: experimental study
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- Journal of Fluid Mechanics / Volume 821 / 25 June 2017
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- 24 May 2017, R1
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Microscopy and Spectroscopy of Catalysts and Energy Storage Materials
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
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- 25 July 2016, pp. 854-855
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- July 2016
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High-Speed Analysis of Pt Based Alloys at High Spatial Resolution using EELS
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- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 2129-2130
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- August 2015
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Aberration corrected STEM-EELS study of the hole distribution in cuprate superconductors
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- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
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- 23 September 2015, pp. 665-666
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- August 2015
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Advances in Electron Energy-Loss Spectroscopy with High Spatial and Energy Resolution
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 2176-2177
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- August 2014
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Studying Tomorrow's Materials Today: Insights with Quantitative STEM, EELS
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
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- 27 August 2014, pp. 78-79
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- August 2014
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Density measurements of laser interaction with ordered structured ‘snow’ targets
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- High Power Laser Science and Engineering / Volume 2 / 01 July 2014
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- 30 May 2014, e15
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Atom Probe Characterization of Corroded Alloy 600
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1020-1021
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- August 2013
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Quantitative STEM and EELS for the Study of Alloy Nanoparticles, Support Materials, and Graphene for Fuel Cell Applications
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
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- 09 October 2013, pp. 1464-1465
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- August 2013
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High-Resolution Near-Edge Structures in EuTiO3, SrTiO3 and BaTiO3
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
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- 23 November 2012, pp. 1460-1461
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- July 2012
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Benefits of Aberration-corrected STEM and EELS in the Study of Nanoscale Materials for Energy and Photonic Applications
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
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- 23 November 2012, pp. 336-337
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- July 2012
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Fabry-Perot Plasmonic Resonances in Silver Nanowire Antennas Imaged with a Sub-Nanometer Electron Probe
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 766-767
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- July 2011
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High-Spatial and High-Energy Resolution EELS Studies of Chemical and Electronic Properties of Interfaces and Nanostructures
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 09 April 2017, pp. 794-795
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- July 2011
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Aberration-Corrected STEM and Atomic EELS Imaging Study of Defects and Interfaces in Thin Films of Layered Structures
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 1320-1321
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- July 2011
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