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Aberration corrected STEM-EELS study of the hole distribution in cuprate superconductors

Published online by Cambridge University Press:  23 September 2015

M. Bugnet ,
G. Radtke ,
S. Loffler ,
P. Schattschneider ,
D. Hawthorn ,
G. A. Sawatzky  and
G. A. Botton
M. Bugnet
Affiliation:
Department of Materials Science and Engineering & CCEM, McMaster University, Hamilton, Canada.
G. Radtke
Affiliation:
UPMC - Paris 6, IMPMC-CNRS UMR 7590 Campus Jussieu, Paris, France.
S. Loffler
Affiliation:
Department of Materials Science and Engineering & CCEM, McMaster University, Hamilton, Canada. Institute of Solid State Physics and USCTEM, Vienna University of Technology, Vienna, Austria.
P. Schattschneider
Affiliation:
Institute of Solid State Physics and USCTEM, Vienna University of Technology, Vienna, Austria.
D. Hawthorn
Affiliation:
Department of Physics and Astronomy, University of Waterloo, Waterloo, ON, Canada.
G. A. Sawatzky
Affiliation:
Department of Physics and Astronomy, University of British Columbia, Vancouver, BC, Canada.
G. A. Botton
Affiliation:
Department of Materials Science and Engineering & CCEM, McMaster University, Hamilton, Canada.

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 665 - 666
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

[1] Pennycook, SJ & Colliex, C, MRS Bulletin 37 (2012). p. 13.Google Scholar
[2] Loffler, S, et al, submitted..Google Scholar
[3] Gauquelin, N, et al, Nature. Communications 4 (2014). p. 1.Google Scholar
[4] Fink, J, et al, Physical Review B 42 (1990). p. 4823.CrossRefGoogle Scholar
[5] Rusydi, A, et al, Physical Review B 75 (2007). p. 104510.Google Scholar
[6] Bugnet, M, et al, in preparation..Google Scholar
[7] The experimental work has been performed at the Canadian Center for Electron Microscopy, a national facility supported by NSERC, the Canada Foundation for Innovation and McMaster University..Google Scholar