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Advances in Electron Energy-Loss Spectroscopy with High Spatial and Energy Resolution

Published online by Cambridge University Press:  27 August 2014

G. A. Botton
Affiliation:
Department of Materials Science and Engineering, McMaster University, Hamilton, ON, Canada
E. P. Bellido
Affiliation:
Department of Materials Science and Engineering, McMaster University, Hamilton, ON, Canada
M. Bugnet
Affiliation:
Department of Materials Science and Engineering, McMaster University, Hamilton, ON, Canada
N. Gauquelin
Affiliation:
Department of Materials Science and Engineering, McMaster University, Hamilton, ON, Canada Now at EMAT, University of Antwerp, Antwerp, Belgium
S. Prabhudev
Affiliation:
Department of Materials Science and Engineering, McMaster University, Hamilton, ON, Canada
D. Rossouw
Affiliation:
Department of Materials Science and Engineering, McMaster University, Hamilton, ON, Canada Now with Department of Materials Science and Metallurgy, University of Cambridge, UK
S. Stambula
Affiliation:
Department of Materials Science and Engineering, McMaster University, Hamilton, ON, Canada
S.Y. Woo
Affiliation:
Department of Materials Science and Engineering, McMaster University, Hamilton, ON, Canada
G.-Z. Zhu
Affiliation:
Department of Materials Science and Engineering, McMaster University, Hamilton, ON, Canada
H. Zhang
Affiliation:
CIfAR Quantum Materials Program and Dept of Physics, Univ. of Toronto, Toronto, ON, Canada
J.Y.T. Wei
Affiliation:
CIfAR Quantum Materials Program and Dept of Physics, Univ. of Toronto, Toronto, ON, Canada

Abstract

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Type
Abstract
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Zhang, H., et al., Applied Physics Letters 103. 052606 (2013).Google Scholar
[2] Zhu, G.-Z., et al., Physical Chemistry Chemical Physics 15, 11420-11426 (2013).Google Scholar
[3] Zhu, G.-Z., Radtke, G., Botton, G.A. Nature, 490 (7420), 384-387 (2012).Google Scholar
[4] Rossouw, D., Bugnet, M., Botton, G.A. Physical Review B 87, 125403 (2013).Google Scholar
[5] Rossouw, D., Botton, G.A. Physical Review Letters 110, 066801 (2013).Google Scholar
[6] Bellido, E.P., et al., to appear in Microscopy and Microanalysis.Google Scholar
[7] The Authors are grateful to NSERC for supporting this research. The microscopy was carried out at the Canadian Centre for Electron Microscopy, a National facility supported by NSERC and McMaster.Google Scholar