9 results
Detection of Single Atoms and Buried Defects in Three Dimensions by Aberration-Corrected Electron Microscope with 0.5-Å Information Limit
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- Journal:
- Microscopy and Microanalysis / Volume 14 / Issue 5 / October 2008
- Published online by Cambridge University Press:
- 16 September 2008, pp. 469-477
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- October 2008
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Practical Electron Microscopy with Correctors and Monochromators
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 860-861
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- August 2007
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In-situ ETEM Analysis of Growth Mechanism of Carbon Nanotubes
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 712-713
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- August 2007
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Atomic Resolution Cs-Corrected HR-S/TEM from 80-300kV
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 1162-1163
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- August 2007
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A New Era of Analysis with Spherical-Abervation Corrected STEM - Atomic and Electronic Information Approaching the Single Atom Level
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1372-1373
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- August 2006
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¡§A New Era of Imaging.¡¨ New Results Beyond the 1 Ångström Barrier
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1466-1467
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- August 2006
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High Resolution TEM at 80kV Acceleration Voltage – Is Approaching 1 Ångström Possible?
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1470-1471
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- August 2006
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Design Advances and New Results of a Sub-Ångström Dedicated Corrector S/TEM
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1370-1371
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- August 2006
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The Design and First Results of a Dedicated Corrector (S)TEM.
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- Journal:
- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 2148-2149
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- August 2005
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