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Insulator Analysis Using Combined FIB-SEM instrument with TOF-SIMS
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 306-307
- Print publication:
- August 2014
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Future Prospects for Defect and Strain Analysis in the SEM via Electron Channeling
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- Journal:
- Microscopy Today / Volume 20 / Issue 2 / March 2012
- Published online by Cambridge University Press:
- 28 February 2012, pp. 12-16
- Print publication:
- March 2012
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